Miyuki FUKUDA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect observation device
- Patent number 10,770,260
- Issue date Sep 8, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT OBSERVATION DEVICE
- Publication number 20190237296
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALIBRATING BIOLOGICAL PARTICLE COUNTER AND CALIBRATION...
- Publication number 20190003951
- Publication date Jan 3, 2019
- Rion Co., Ltd.
- Kazuma SEKIMOTO
- G01 - MEASURING TESTING