Miyuki Kaneyama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for obtaining and processing surface analysis data
- Patent number 7,498,573
- Issue date Mar 3, 2009
- Jeol Ltd.
- Miyuki Kaneyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for managing data
- Patent number 6,778,944
- Issue date Aug 17, 2004
- Jeol Ltd.
- Miyuki Kaneyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analytical method for electron microscopy
- Patent number 6,774,362
- Issue date Aug 10, 2004
- Jeol Ltd.
- Masumi Katagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,528,787
- Issue date Mar 4, 2003
- Jeol Ltd.
- Masumi Katagami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for obtaining and processing surface analysis data
- Publication number 20080029698
- Publication date Feb 7, 2008
- JEOL Ltd.
- Miyuki Kaneyama
- G01 - MEASURING TESTING
Information Patent Application
Method and system for managing data
- Publication number 20030110010
- Publication date Jun 12, 2003
- JEOL Ltd.
- Miyuki Kaneyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analytical method for electron microscopy
- Publication number 20030089851
- Publication date May 15, 2003
- JEOL Ltd.
- Masumi Katagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20010022346
- Publication date Sep 20, 2001
- JEOL Ltd.
- Masumi Katagami
- H01 - BASIC ELECTRIC ELEMENTS