Miyuki Takenaka

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of quantitative analysis of hexavalent chromium in chromate...
- Patent number 9,261,493
- Issue date Feb 16, 2016
- Kabushiki Kaisha Toshiba
- Tetsuya Tachibe
- G01 - MEASURING TESTING
Information Patent Grant
Method for extracting hexavalent chromium in a polymer material
- Patent number 8,628,600
- Issue date Jan 14, 2014
- Kabushiki Kaisha Toshiba
- Miho Muramatsu
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Method of quantitative analysis of hexavalent chromium in chromate...
- Patent number 8,223,917
- Issue date Jul 17, 2012
- Kabushiki Kaisha Toshiba
- Mitsuhiro Oki
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing antimony contained in glass
- Patent number 8,114,672
- Issue date Feb 14, 2012
- Kabushiki Kaisha Toshiba
- Sayaka Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for quantitative analysis of metal element contained in resi...
- Patent number 7,727,767
- Issue date Jun 1, 2010
- Kaushiki Kaisha Toshiba
- Miyuki Takenaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE...
- Publication number 20120264225
- Publication date Oct 18, 2012
- Mitsuhiro OKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXTRACTING HEXAVALENT CHROMIUM IN A POLYMER MATERIAL
- Publication number 20120137830
- Publication date Jun 7, 2012
- Kabushiki Kaisha Toshiba
- Miho Muramatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING ANTIMONY CONTAINED IN GLASS
- Publication number 20110217782
- Publication date Sep 8, 2011
- Kabushiki Kaisha Toshiba
- Sayaka Morimoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE...
- Publication number 20100091944
- Publication date Apr 15, 2010
- Mitsuhiro OKI
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR AND PRODUCTION METHOD THEREOF
- Publication number 20080250847
- Publication date Oct 16, 2008
- Kabushiki Kaisha Toshiba
- Tomoyuki KITANI
- G01 - MEASURING TESTING
Information Patent Application
Method of quantitative analysis of hexavalent chromium in chromate...
- Publication number 20070048873
- Publication date Mar 1, 2007
- KABUSHIKI KAISHA TOSHIBA
- Tetsuya Tachibe
- G01 - MEASURING TESTING
Information Patent Application
Method for quantitative analysis of metal element contained in resi...
- Publication number 20070026526
- Publication date Feb 1, 2007
- Miyuki Takenaka
- G01 - MEASURING TESTING
Information Patent Application
Analytical vessel and trace element analysis method
- Publication number 20050271556
- Publication date Dec 8, 2005
- Miyuki Takenaka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Miyuki Takenaka

Person

Patents Grantslast 30 patents

Method of quantitative analysis of hexavalent chromium in chromate...

Method for extracting hexavalent chromium in a polymer material

Method of quantitative analysis of hexavalent chromium in chromate...

Method for analyzing antimony contained in glass

Method for quantitative analysis of metal element contained in resi...

Patents Applicationslast 30 patents

METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE...

METHOD FOR EXTRACTING HEXAVALENT CHROMIUM IN A POLYMER MATERIAL

METHOD FOR ANALYZING ANTIMONY CONTAINED IN GLASS

METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE...

DETECTOR AND PRODUCTION METHOD THEREOF

Method of quantitative analysis of hexavalent chromium in chromate...

Method for quantitative analysis of metal element contained in resi...

Analytical vessel and trace element analysis method