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Mizuki Iwanami
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Probe for electric/magnetic field
Patent number
9,182,427
Issue date
Nov 10, 2015
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic field measuring apparatus, electromagnetic field me...
Patent number
8,941,402
Issue date
Jan 27, 2015
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Infrared ray sensor, infrared ray detection device, and electronic...
Patent number
8,921,791
Issue date
Dec 30, 2014
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic field measurement apparatus
Patent number
8,654,331
Issue date
Feb 18, 2014
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Electric field/magnetic field sensors and methods of fabricating th...
Patent number
8,519,323
Issue date
Aug 27, 2013
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Grant
Transmission line filter
Patent number
8,508,318
Issue date
Aug 13, 2013
NEC Corporation
Mizuki Iwanami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electric field sensor, magnetic field sensor, electromagnetic field...
Patent number
8,233,753
Issue date
Jul 31, 2012
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Electric field sensor and method for fabricating the same
Patent number
8,153,955
Issue date
Apr 10, 2012
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measuring apparatus capable of measuring at high spa...
Patent number
7,385,393
Issue date
Jun 10, 2008
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer printed board with a double plane spiral interconnection...
Patent number
6,963,034
Issue date
Nov 8, 2005
NEC Corporation
Mizuki Iwanami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Interlayer structure with multiple insulative layers with different...
Patent number
6,603,668
Issue date
Aug 5, 2003
NEC Corporation
Mizuki Iwanami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Printed circuit board with multiple insulative magnetic layers
Patent number
6,396,713
Issue date
May 28, 2002
NEC Corporation
Mizuki Iwanami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Multilayer printed board with a double plane spiral interconnection...
Patent number
6,384,706
Issue date
May 7, 2002
NEC Corporation
Mizuki Iwanami
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND S...
Publication number
20170076027
Publication date
Mar 16, 2017
NEC Corporation
Mizuki IWANAMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WIRING SUBSTRATE, SEMICONDUCTOR DEVICE, PRINTED BOARD, AND METHOD F...
Publication number
20160029477
Publication date
Jan 28, 2016
NEC Corporation
Mizuki IWANAMI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
INFRARED DETECTION SENSOR ARRAY AND INFRARED DETECTION DEVICE
Publication number
20130320213
Publication date
Dec 5, 2013
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
INFRARED RAY SENSOR, INFRARED RAY DETECTION DEVICE, AND ELECTRONIC...
Publication number
20120312988
Publication date
Dec 13, 2012
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC FIELD/MAGNETIC FIELD SENSORS AND METHODS OF FABRICATING TH...
Publication number
20120164321
Publication date
Jun 28, 2012
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Application
PROBE FOR ELECTRIC/MAGNETIC FIELD
Publication number
20120121217
Publication date
May 17, 2012
NEC Corporation
Mizuki Iwanami
G02 - OPTICS
Information
Patent Application
ELECTROMAGNETIC FIELD MEASURING APPARATUS, ELECTROMAGNETIC FIELD ME...
Publication number
20120098560
Publication date
Apr 26, 2012
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC FIELD MEASUREMENT DEVICE
Publication number
20110001971
Publication date
Jan 6, 2011
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION LINE FILTER
Publication number
20100109807
Publication date
May 6, 2010
NEC Corporation
Mizuki Iwanami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRIC FIELD SENSOR, MAGNETIC FIELD SENSOR, ELECTROMAGNETIC FIELD...
Publication number
20090234619
Publication date
Sep 17, 2009
NEC Corporation
Mizuki Iwanami
G02 - OPTICS
Information
Patent Application
ELECTRIC FIELD/MAGNETIC FIELD SENSORS AND METHODS OF FABRICATING TH...
Publication number
20090224753
Publication date
Sep 10, 2009
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASURING APPARATUS CAPABLE OF MEASURING AT HIGH SPA...
Publication number
20080238419
Publication date
Oct 2, 2008
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field measuring apparatus capable of measuring at high spa...
Publication number
20050190358
Publication date
Sep 1, 2005
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Application
Multilayer printed board with a double plane spiral interconnection...
Publication number
20020109573
Publication date
Aug 15, 2002
NEC Corporation
Mizuki Iwanami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interlayer structure with multiple insulative layers with different...
Publication number
20020089798
Publication date
Jul 11, 2002
NEC Corporation
Mizuki Iwanami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR