Mizuki MOHARA

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Patents Grantslast 30 patents

Information Patent Grant
Far-infrared spectroscopy device and far-infrared spectroscopy method
- Patent number 11,977,026
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Mizuki Mohara
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared light source and far-infrared spectrometer
- Patent number 11,644,418
- Issue date May 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Far-infrared spectroscopic device and far-infrared spectroscopic me...
- Patent number 11,016,023
- Issue date May 25, 2021
- Hitachi High-Technologies Corporation
- Mizuki Mohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Far-Infrared Spectroscopy Device and Sample Adapter
- Publication number 20240288365
- Publication date Aug 29, 2024
- Hitachi High-Tech Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device
- Publication number 20230236123
- Publication date Jul 27, 2023
- Hitachi High-Tech Corporation
- Touya ONO
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopy Device and Far-Infrared Spectroscopy Method
- Publication number 20220412885
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Light Source and Far-Infrared Spectrometer
- Publication number 20210381965
- Publication date Dec 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Kei SHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Spectroscopic Device and Far-Infrared Spectroscopic Me...
- Publication number 20210131957
- Publication date May 6, 2021
- Hitachi High-Technologies Corporation
- Mizuki MOHARA
- G01 - MEASURING TESTING
Information Patent Application
Far-Infrared Light Source and Far-Infrared Spectrometer
- Publication number 20200371023
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Kei SHIMURA
- G01 - MEASURING TESTING