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Mizuki OKU
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Far-infrared spectroscopy device
Patent number
11,320,309
Issue date
May 3, 2022
HITACHI HIGH-TECH CORPORATION
Kei Shimura
G02 - OPTICS
Information
Patent Grant
Far-infrared spectroscopy device
Patent number
11,079,275
Issue date
Aug 3, 2021
HITACHI HIGH-TECH CORPORATION
Kei Shimura
G01 - MEASURING TESTING
Information
Patent Grant
Far-infrared spectroscopy device
Patent number
10,948,347
Issue date
Mar 16, 2021
HITACHI HIGH-TECH CORPORATION
Kei Shimura
G01 - MEASURING TESTING
Information
Patent Grant
Optical microscope device and testing apparatus comprising same
Patent number
9,851,548
Issue date
Dec 26, 2017
Hitachi High-Technologies Corporation
Kei Shimura
G02 - OPTICS
Information
Patent Grant
Light source device, surface inspecting apparatus using the device,...
Patent number
9,157,866
Issue date
Oct 13, 2015
Hitachi High-Technologies Corporation
Shigeru Matsui
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus
Patent number
8,976,347
Issue date
Mar 10, 2015
Hitachi High-Technologies Corporation
Mizuki Oku
G01 - MEASURING TESTING
Information
Patent Grant
Light source device, surface inspecting apparatus using the device,...
Patent number
8,743,357
Issue date
Jun 3, 2014
Hitachi High-Technologies Corporation
Shigeru Matsui
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FAR-INFRARED SPECTROSCOPY DEVICE
Publication number
20210310865
Publication date
Oct 7, 2021
HITACHI HIGH-TECH CORPORATION
Kei SHIMURA
G01 - MEASURING TESTING
Information
Patent Application
Far-Infrared Spectroscopy Device
Publication number
20200088577
Publication date
Mar 19, 2020
Hitachi High-Technologies Corporation
Kei SHIMURA
G02 - OPTICS
Information
Patent Application
Far-Infrared Spectroscopy Device
Publication number
20180209848
Publication date
Jul 26, 2018
Hitachi High-Technologies Corporation
Kei SHIMURA
G02 - OPTICS
Information
Patent Application
OPTICAL MICROSCOPE DEVICE AND TESTING APPARATUS COMPRISING SAME
Publication number
20140210983
Publication date
Jul 31, 2014
Hitachi High-Technologies Corporation
Kei Shimura
G02 - OPTICS
Information
Patent Application
LIGHT SOURCE DEVICE, SURFACE INSPECTING APPARATUS USING THE DEVICE,...
Publication number
20140185041
Publication date
Jul 3, 2014
Hitachi High-Technologies Corporation
Shigeru MATSUI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS
Publication number
20140160470
Publication date
Jun 12, 2014
Hitachi High-Technologies Corporation
Mizuki Oku
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20130148113
Publication date
Jun 13, 2013
Hitachi High-Technologies Corporation
Mizuki Oku
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SOURCE DEVICE, SURFACE INSPECTING APPARATUS USING THE DEVICE,...
Publication number
20110134418
Publication date
Jun 9, 2011
Shigeru Matsui
G01 - MEASURING TESTING