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Moez KANOUN
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Waterloo, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Potentiostat with offset calibration
Patent number
12,007,358
Issue date
Jun 11, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Moez Kanoun
G01 - MEASURING TESTING
Information
Patent Grant
Potentiostat circuit
Patent number
11,381,205
Issue date
Jul 5, 2022
Semiconductor Components Industries, LLC
Moez Kanoun
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Bandgap reference circuit
Patent number
11,099,594
Issue date
Aug 24, 2021
Semiconductor Components Industries, LLC
Moez Kanoun
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
POTENTIOSTAT WITH OFFSET CALIBRATION
Publication number
20240310325
Publication date
Sep 19, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Moez KANOUN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BANDGAP CIRCUIT WITH NOISE REDUCTION AND TEMPERATURE STABILITY
Publication number
20230288951
Publication date
Sep 14, 2023
Semiconductor Components Industries, LLC
Moez KANOUN
G05 - CONTROLLING REGULATING
Information
Patent Application
SENSOR READOUT CIRCUIT AND METHOD
Publication number
20230284926
Publication date
Sep 14, 2023
Semiconductor Components Industries, LLC
Moez KANOUN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POTENTIOSTAT WITH OFFSET CALIBRATION
Publication number
20210262977
Publication date
Aug 26, 2021
Semiconductor Components Industries, LLC
Moez KANOUN
G01 - MEASURING TESTING
Information
Patent Application
BANDGAP REFERENCE CIRCUIT
Publication number
20210263549
Publication date
Aug 26, 2021
Semiconductor Components Industries, LLC
Moez KANOUN
G05 - CONTROLLING REGULATING
Information
Patent Application
POTENTIOSTAT CIRCUIT
Publication number
20210091728
Publication date
Mar 25, 2021
Semiconductor Components Industries, LLC
Moez KANOUN
G01 - MEASURING TESTING