Mohamed Ahmed AbouKhousa

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London, CA

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Patents Grantslast 30 patents

Information Patent Grant
High frequency analysis of a device under test
- Patent number 9,081,045
- Issue date Jul 14, 2015
- The Curators of the University of Missouri
- Reza Zoughi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DECOUPLING MAGNETIC RESONANCE IMAGING RADIO F...
- Publication number 20150369886
- Publication date Dec 24, 2015
- MRI INNOVATIONS
- Ravi Menon
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DECOUPLING MAGENTIC RESONANCE IMAGING RADIO F...
- Publication number 20150355297
- Publication date Dec 10, 2015
- Ravi Menon
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST
- Publication number 20120235696
- Publication date Sep 20, 2012
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Reza Zoughi
- G01 - MEASURING TESTING
Information Patent Application
MICROWAVE AND MILLIMETER WAVE RESONANT SENSOR HAVING PERPENDICULAR...
- Publication number 20100328142
- Publication date Dec 30, 2010
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Reza Zoughi
- G01 - MEASURING TESTING