Mohamed Azimane

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Testing a memory which includes conservative reversible logic
- Patent number 11,435,940
- Issue date Sep 6, 2022
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing a static random access memory
- Patent number 7,885,093
- Issue date Feb 8, 2011
- NXP B.V.
- Paul Wielage
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for testing defects in an electronic circuit
- Patent number 7,689,878
- Issue date Mar 30, 2010
- NXP B.V.
- Mohamed Azimane
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for detecting resistive-open defects in semiconductor memories
- Patent number 7,536,610
- Issue date May 19, 2009
- Koninklijke Philips Electronics N.V.
- Mohamed Azimane
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM test method and SRAM test arrangement to detect weak cells
- Patent number 7,463,508
- Issue date Dec 9, 2008
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing ram address decoder for resistive open defects
- Patent number 7,392,465
- Issue date Jun 24, 2008
- NXP B.V.
- Mohamed Azimane
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTING A MEMORY WHICH INCLUDES CONSERVATIVE REVERSIBLE LOGIC
- Publication number 20220244881
- Publication date Aug 4, 2022
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR TESTING A STATIC RANDOM ACCESS MEMORY
- Publication number 20100014369
- Publication date Jan 21, 2010
- NXP, B.V.
- Paul Wielage
- G11 - INFORMATION STORAGE
Information Patent Application
Sram Test Method and Sram Test Arrangement to Detect Weak Cells
- Publication number 20080106956
- Publication date May 8, 2008
- Koninklijke Philips Electronics N.V.
- Jose De Jesus Pineda De Gyvez
- G11 - INFORMATION STORAGE
Information Patent Application
Dft Technique for Stressing Self-Timed Semiconductor Memories to De...
- Publication number 20070257716
- Publication date Nov 8, 2007
- Mohamed Azimane
- G11 - INFORMATION STORAGE
Information Patent Application
Testing ram address decoder for resistive open defects
- Publication number 20070067706
- Publication date Mar 22, 2007
- Koninklijke Philips Electronics N.V. Groenewoudseweg 1
- Mohamed Azimane
- G11 - INFORMATION STORAGE
Information Patent Application
Test of ram address decoder for resistive open defects
- Publication number 20070033453
- Publication date Feb 8, 2007
- Koninklijke Philips Electronics N.V.
- Mohamed Azimane
- G11 - INFORMATION STORAGE
Information Patent Application
Method for detecting resistive-open defects in semiconductor memories
- Publication number 20050216799
- Publication date Sep 29, 2005
- Mohamed Azimane
- G11 - INFORMATION STORAGE

Mohamed Azimane

Person

Patents Grantslast 30 patents

Testing a memory which includes conservative reversible logic

Method for testing a static random access memory

System and method for testing defects in an electronic circuit

Method for detecting resistive-open defects in semiconductor memories

SRAM test method and SRAM test arrangement to detect weak cells

Testing ram address decoder for resistive open defects

Patents Applicationslast 30 patents

TESTING A MEMORY WHICH INCLUDES CONSERVATIVE REVERSIBLE LOGIC

METHOD FOR TESTING A STATIC RANDOM ACCESS MEMORY

Sram Test Method and Sram Test Arrangement to Detect Weak Cells

Dft Technique for Stressing Self-Timed Semiconductor Memories to De...

Testing ram address decoder for resistive open defects

Test of ram address decoder for resistive open defects

Method for detecting resistive-open defects in semiconductor memories