Mohamed Buhary Rinzan

Person

Manlius, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Unconsumed precursor monitoring
- Patent number 11,929,270
- Issue date Mar 12, 2024
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Unconsumed precursor monitoring
- Patent number 11,335,575
- Issue date May 17, 2022
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process monitoring using crystal with reactance sensor
- Patent number 11,175,323
- Issue date Nov 16, 2021
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring thin film deposition
- Patent number 10,704,150
- Issue date Jul 7, 2020
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
QUARTZ CRYSTAL MICROBALANCE (QCM) SENSOR HAVING RAPID REGISTRATION...
- Publication number 20240329001
- Publication date Oct 3, 2024
- Inficon, Inc.
- David Y. Lee
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM AND METHOD FOR MASS FLOW MEASUREMENT AND CONTROL OF PROCES...
- Publication number 20240263313
- Publication date Aug 8, 2024
- Inficon, Inc.
- Steve Lakeman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR DECONVOLUTION OF REAL-TIME MASS FROM THE INFL...
- Publication number 20240241083
- Publication date Jul 18, 2024
- Inficon, Inc.
- Chunhua Song
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING SEMICONDUCTOR PROCESSES
- Publication number 20230135167
- Publication date May 4, 2023
- Inficon Inc.
- Matan Lapidot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNCONSUMED PRECURSOR MONITORING
- Publication number 20220285184
- Publication date Sep 8, 2022
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING THIN FILM DEPOSITION
- Publication number 20200325580
- Publication date Oct 15, 2020
- Inficon, Inc.
- Mohamed B. Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
UNCONSUMED PRECURSOR MONITORING
- Publication number 20200176291
- Publication date Jun 4, 2020
- Inficon Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROCESS MONITORING USING CRYSTAL WITH REACTANCE SENSOR
- Publication number 20180267086
- Publication date Sep 20, 2018
- Inficon, Inc.
- Mohamed Buhary Rinzan
- G01 - MEASURING TESTING
Information Patent Application
MONITORING THIN FILM DEPOSITION
- Publication number 20160215397
- Publication date Jul 28, 2016
- Inficon Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Mohamed Buhary Rinzan

Person

Patents Grantslast 30 patents

Unconsumed precursor monitoring

Unconsumed precursor monitoring

Process monitoring using crystal with reactance sensor

Monitoring thin film deposition

Patents Applicationslast 30 patents

QUARTZ CRYSTAL MICROBALANCE (QCM) SENSOR HAVING RAPID REGISTRATION...

A SYSTEM AND METHOD FOR MASS FLOW MEASUREMENT AND CONTROL OF PROCES...

SYSTEM AND METHOD FOR DECONVOLUTION OF REAL-TIME MASS FROM THE INFL...

SYSTEM AND METHOD FOR MONITORING SEMICONDUCTOR PROCESSES

UNCONSUMED PRECURSOR MONITORING

MONITORING THIN FILM DEPOSITION

UNCONSUMED PRECURSOR MONITORING

PROCESS MONITORING USING CRYSTAL WITH REACTANCE SENSOR

MONITORING THIN FILM DEPOSITION