Mohamed SAIB

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SAINT MARTIN D'HERES, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining the dose corrections to be applied to an IC...
- Patent number 10,578,978
- Issue date Mar 3, 2020
- Aselta Nanographics
- Mohamed Saib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of performing dose modulation, in particular for electron be...
- Patent number 10,522,328
- Issue date Dec 31, 2019
- Aselta Nanographics
- Mohamed Saib
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for calculating the metrics of an IC manufacturing process
- Patent number 10,423,074
- Issue date Sep 24, 2019
- Aselta Nanographics
- Mohamed Saïb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining the parameters of an IC manufacturing proces...
- Patent number 10,295,912
- Issue date May 21, 2019
- Aselta Nanographics
- Mohamed Saib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining the parameters of an IC manufacturing proces...
- Patent number 10,156,796
- Issue date Dec 18, 2018
- Aselta Nanographics
- Mohamed Saïb
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING THE DOSE CORRECTIONS TO BE APPLIED TO AN IC...
- Publication number 20180203361
- Publication date Jul 19, 2018
- ASELTA NANOGRAPHICS
- Mohamed SAIB
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF PERFORMING DOSE MODULATION, IN PARTICULAR FOR ELECTRON BE...
- Publication number 20180204707
- Publication date Jul 19, 2018
- ASELTA NANOGRAPHICS
- Mohamed SAIB
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING THE PARAMETERS OF AN IC MANUFACTURING PROCES...
- Publication number 20170168401
- Publication date Jun 15, 2017
- ASELTA NANOGRAPHICS
- Mohamed SAIB
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALCULATING THE METRICS OF AN IC MANUFACTURING PROCESS
- Publication number 20170123322
- Publication date May 4, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Mohamed SAÏB
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING THE PARAMETERS OF AN IC MANUFACTURING PROCES...
- Publication number 20170075225
- Publication date Mar 16, 2017
- ASELTA NANOGRAPHICS
- Mohamed SAÏB
- G06 - COMPUTING CALCULATING COUNTING