Mohammad B. Shabani

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of etching surface layer portion of silicon wafer and method...
- Patent number 8,815,107
- Issue date Aug 26, 2014
- Sumco Corporation
- Jiahong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating thermal treatment and method of manufacturing...
- Patent number 7,892,862
- Issue date Feb 22, 2011
- Sumco Corporation
- Takafumi Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for assaying copper in silicon wafers
- Patent number 7,888,265
- Issue date Feb 15, 2011
- Sumco Corporation
- Katsuya Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing impurity
- Patent number 7,601,538
- Issue date Oct 13, 2009
- Sumco Corporation
- Yoshikazu Shiina
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting Cu concentration of silicon substrate
- Patent number 7,601,541
- Issue date Oct 13, 2009
- Sumco Corporation
- Shabani B. Mohammad
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing impurities in a silicon substrate and apparatu...
- Patent number 6,995,834
- Issue date Feb 7, 2006
- Mitsubishi Materials Silicon Corp.
- Mohammad B. Shabani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ETCHING SURFACE LAYER PORTION OF SILICON WAFER AND METHOD...
- Publication number 20120077290
- Publication date Mar 29, 2012
- SUMCO CORPORATION
- Jiahong WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING THERMAL TREATMENT AND METHOD OF MANUFACTURING...
- Publication number 20080020496
- Publication date Jan 24, 2008
- SUMCO CORPORATION
- Takafumi YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for assaying copper in silicon wafers
- Publication number 20070207616
- Publication date Sep 6, 2007
- Katsuya Hirano
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing impurity
- Publication number 20060003455
- Publication date Jan 5, 2006
- SUMCO CORPORATION
- Yoshikazu Shiina
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting Cu concentration of silicon substrate
- Publication number 20040248311
- Publication date Dec 9, 2004
- Shabani B. Mohammad
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing impurities in a silicon substrate and apparatu...
- Publication number 20020101576
- Publication date Aug 1, 2002
- Mitsubishi Materials Silicon Corporation
- Mohammad B. Shabani
- G01 - MEASURING TESTING