Mohammad Mehedi Hasan

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
High aspect ratio source or drain structures with abrupt dopant pro...
- Patent number 11,804,523
- Issue date Oct 31, 2023
- Intel Corporation
- Ryan Keech
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage detector with high voltage protection
- Patent number 9,541,583
- Issue date Jan 10, 2017
- Intel Corporation
- Harmander Singh
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING CUT METAL GATES
- Publication number 20240347539
- Publication date Oct 17, 2024
- Intel Corporation
- Tahir GHANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...
- Publication number 20240154037
- Publication date May 9, 2024
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EPITAXIAL STRUCTURE AND GATE METAL STRUCTURES WITH A PLANAR TOP SUR...
- Publication number 20240113116
- Publication date Apr 4, 2024
- Intel Corporation
- Dan S. LAVRIC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH UNIFORM EPITAXIAL SOURCE OR DRAI...
- Publication number 20240105774
- Publication date Mar 28, 2024
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ASPECT RATIO SOURCE OR DRAIN STRUCTURES WITH ABRUPT DOPANT PRO...
- Publication number 20240014268
- Publication date Jan 11, 2024
- Intel Corporation
- Ryan KEECH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING NECKED FEATURE
- Publication number 20230317786
- Publication date Oct 5, 2023
- Intel Corporation
- Rishabh MEHANDRU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE OR DRAIN STRUCTURES WITH SELECTIVE SILICIDE CONTACTS THEREON
- Publication number 20230317789
- Publication date Oct 5, 2023
- Intel Corporation
- Dan S. LAVRIC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE CUT STRUCTURES
- Publication number 20230282701
- Publication date Sep 7, 2023
- Intel Corporation
- Leonard P. Guler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP ETCH PROCESSING FOR TRANSISTORS HAVING VARYING PITCH
- Publication number 20230282718
- Publication date Sep 7, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE CONTACTS WRAPPED AROUND EPITAXIAL SOURCE OR DRAIN REGIONS
- Publication number 20230275124
- Publication date Aug 31, 2023
- Intel Corporation
- Leonard P. Guler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS WITH GATE PLUGS TO INDUCE COMPRESSIVE CHANNEL S...
- Publication number 20230207696
- Publication date Jun 29, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF METAL CONTACTS TO SILICON GERMANIUM LAYERS WITH ETCH R...
- Publication number 20230207655
- Publication date Jun 29, 2023
- Intel Corporation
- Rushabh D. Shah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EPI BARRIER ALIGNED BACKSIDE CONTACT
- Publication number 20230207623
- Publication date Jun 29, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...
- Publication number 20230207651
- Publication date Jun 29, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SRAM WITH CHANNEL COUNT CONTRAST FOR GREATER READ STABILITY
- Publication number 20230209798
- Publication date Jun 29, 2023
- Intel Corporation
- Clifford Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATE PLUG LANDED ON DIEL...
- Publication number 20230197816
- Publication date Jun 22, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF CAVITY SPACER AND SOURCE-DRAIN EPITAXIAL GROWTH FOR SC...
- Publication number 20230197818
- Publication date Jun 22, 2023
- Intel Corporation
- Nitesh Kumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING RAISED WALL ST...
- Publication number 20230197713
- Publication date Jun 22, 2023
- Intel Corporation
- Guillaume BOUCHE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...
- Publication number 20230197838
- Publication date Jun 22, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...
- Publication number 20230197855
- Publication date Jun 22, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...
- Publication number 20230197854
- Publication date Jun 22, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING EPITAXIAL SOUR...
- Publication number 20230197722
- Publication date Jun 22, 2023
- Intel Corporation
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEPOPULATED CH...
- Publication number 20230178622
- Publication date Jun 8, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTORS WITH REDUCED EPITAXIAL SOURCE/DRAIN SPAN VIA ETCH-BACK...
- Publication number 20230095191
- Publication date Mar 30, 2023
- Intel Corporation
- Koustav Ganguly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC GATE WALL AND DIELE...
- Publication number 20230093657
- Publication date Mar 23, 2023
- Intel Corporation
- Mohit K. HARAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DOPED SUBFIN
- Publication number 20230088753
- Publication date Mar 23, 2023
- Intel Corporation
- Stephen M. Cea
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE DEPOPULATION OF GATE-ALL-AROUND SEMICONDUCTOR DEVICES
- Publication number 20230084182
- Publication date Mar 16, 2023
- Intel Corporation
- Mohammad Hasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVELY THINNED GATE-ALL-AROUND (GAA) STRUCTURES
- Publication number 20230079586
- Publication date Mar 16, 2023
- Intel Corporation
- Mohammad Hasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATES WITH TAPERED PLUGS
- Publication number 20220415890
- Publication date Dec 29, 2022
- Intel Corporation
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL LINE PROFILE SHAPING FOR ADVANCED INTEGRATED CIRCUIT STRUCTUR...
- Publication number 20220415791
- Publication date Dec 29, 2022
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS

Mohammad Mehedi Hasan

Person

Patents Grantslast 30 patents

High aspect ratio source or drain structures with abrupt dopant pro...

Voltage detector with high voltage protection

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT STRUCTURES HAVING CUT METAL GATES

INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...

EPITAXIAL STRUCTURE AND GATE METAL STRUCTURES WITH A PLANAR TOP SUR...

INTEGRATED CIRCUIT STRUCTURES WITH UNIFORM EPITAXIAL SOURCE OR DRAI...

HIGH ASPECT RATIO SOURCE OR DRAIN STRUCTURES WITH ABRUPT DOPANT PRO...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING NECKED FEATURE

SOURCE OR DRAIN STRUCTURES WITH SELECTIVE SILICIDE CONTACTS THEREON

GATE CUT STRUCTURES

DEEP ETCH PROCESSING FOR TRANSISTORS HAVING VARYING PITCH

CONDUCTIVE CONTACTS WRAPPED AROUND EPITAXIAL SOURCE OR DRAIN REGIONS

INTEGRATED CIRCUITS WITH GATE PLUGS TO INDUCE COMPRESSIVE CHANNEL S...

FORMATION OF METAL CONTACTS TO SILICON GERMANIUM LAYERS WITH ETCH R...

EPI BARRIER ALIGNED BACKSIDE CONTACT

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...

SRAM WITH CHANNEL COUNT CONTRAST FOR GREATER READ STABILITY

INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATE PLUG LANDED ON DIEL...

FORMATION OF CAVITY SPACER AND SOURCE-DRAIN EPITAXIAL GROWTH FOR SC...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING RAISED WALL ST...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...

INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING EPITAXIAL SOUR...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEPOPULATED CH...

TRANSISTORS WITH REDUCED EPITAXIAL SOURCE/DRAIN SPAN VIA ETCH-BACK...

INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC GATE WALL AND DIELE...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DOPED SUBFIN

SELECTIVE DEPOPULATION OF GATE-ALL-AROUND SEMICONDUCTOR DEVICES

SELECTIVELY THINNED GATE-ALL-AROUND (GAA) STRUCTURES

INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATES WITH TAPERED PLUGS

METAL LINE PROFILE SHAPING FOR ADVANCED INTEGRATED CIRCUIT STRUCTUR...