Mohammad Mehedi Hasan

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fabrication of gate-all-around integrated circuit structures having...
- Patent number 12,369,392
- Issue date Jul 22, 2025
- Intel Corporation
- Leonard P. Guler
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit structures with backside gate partial cut or tre...
- Patent number 12,364,001
- Issue date Jul 15, 2025
- Intel Corporation
- Leonard P. Guler
Information Patent Grant
Integrated circuit structures having metal gates with tapered plugs
- Patent number 12,364,002
- Issue date Jul 15, 2025
- Intel Corporation
- Mohammad Hasan
Information Patent Grant
High aspect ratio source or drain structures with abrupt dopant pro...
- Patent number 12,288,808
- Issue date Apr 29, 2025
- Intel Corporation
- Ryan Keech
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Localized spacer for nanowire transistors and methods of fabrication
- Patent number 12,176,408
- Issue date Dec 24, 2024
- Intel Corporation
- Sudipto Naskar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of gate-all-around integrated circuit structures having...
- Patent number 11,990,472
- Issue date May 21, 2024
- Intel Corporation
- Leonard P. Guler
- G11 - INFORMATION STORAGE
Information Patent Grant
High aspect ratio source or drain structures with abrupt dopant pro...
- Patent number 11,804,523
- Issue date Oct 31, 2023
- Intel Corporation
- Ryan Keech
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage detector with high voltage protection
- Patent number 9,541,583
- Issue date Jan 10, 2017
- Intel Corporation
- Harmander Singh
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC GATE WALL AND DIELE...
- Publication number 20250227988
- Publication date Jul 10, 2025
- Intel Corporation
- Mohit K. HARAN
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH BACKSIDE GATE PARTIAL CUT OR TRE...
- Publication number 20250227991
- Publication date Jul 10, 2025
- Intel Corporation
- Leonard P. GULER
Information Patent Application
INTEGRATED CIRCUIT STRUCTURE WITH VARIED SUB-FIN TRENCHES AND EPITA...
- Publication number 20250204029
- Publication date Jun 19, 2025
- Intel Corporation
- Leonard P. GULER
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING CUT METAL GATES
- Publication number 20250133821
- Publication date Apr 24, 2025
- Intel Corporation
- Tahir GHANI
Information Patent Application
STACKED CMOS TRANSISTOR STRUCTURES WITH COMPLEMENTARY CHANNEL MATER...
- Publication number 20250006737
- Publication date Jan 2, 2025
- Intel Corporation
- Aryan Navabi-Shirazi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH INTERNAL SPACER LINERS
- Publication number 20250006808
- Publication date Jan 2, 2025
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH REMOVED SUB-FIN
- Publication number 20250006547
- Publication date Jan 2, 2025
- Intel Corporation
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING CUT METAL GATES
- Publication number 20240347539
- Publication date Oct 17, 2024
- Intel Corporation
- Tahir GHANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING...
- Publication number 20240178226
- Publication date May 30, 2024
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...
- Publication number 20240154037
- Publication date May 9, 2024
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EPITAXIAL STRUCTURE AND GATE METAL STRUCTURES WITH A PLANAR TOP SUR...
- Publication number 20240113116
- Publication date Apr 4, 2024
- Intel Corporation
- Dan S. LAVRIC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH UNIFORM EPITAXIAL SOURCE OR DRAI...
- Publication number 20240105774
- Publication date Mar 28, 2024
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ASPECT RATIO SOURCE OR DRAIN STRUCTURES WITH ABRUPT DOPANT PRO...
- Publication number 20240014268
- Publication date Jan 11, 2024
- Intel Corporation
- Ryan KEECH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING NECKED FEATURE
- Publication number 20230317786
- Publication date Oct 5, 2023
- Intel Corporation
- Rishabh MEHANDRU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE OR DRAIN STRUCTURES WITH SELECTIVE SILICIDE CONTACTS THEREON
- Publication number 20230317789
- Publication date Oct 5, 2023
- Intel Corporation
- Dan S. LAVRIC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE CUT STRUCTURES
- Publication number 20230282701
- Publication date Sep 7, 2023
- Intel Corporation
- Leonard P. Guler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP ETCH PROCESSING FOR TRANSISTORS HAVING VARYING PITCH
- Publication number 20230282718
- Publication date Sep 7, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE CONTACTS WRAPPED AROUND EPITAXIAL SOURCE OR DRAIN REGIONS
- Publication number 20230275124
- Publication date Aug 31, 2023
- Intel Corporation
- Leonard P. Guler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS WITH GATE PLUGS TO INDUCE COMPRESSIVE CHANNEL S...
- Publication number 20230207696
- Publication date Jun 29, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF METAL CONTACTS TO SILICON GERMANIUM LAYERS WITH ETCH R...
- Publication number 20230207655
- Publication date Jun 29, 2023
- Intel Corporation
- Rushabh D. Shah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EPI BARRIER ALIGNED BACKSIDE CONTACT
- Publication number 20230207623
- Publication date Jun 29, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...
- Publication number 20230207651
- Publication date Jun 29, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SRAM WITH CHANNEL COUNT CONTRAST FOR GREATER READ STABILITY
- Publication number 20230209798
- Publication date Jun 29, 2023
- Intel Corporation
- Clifford Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATE PLUG LANDED ON DIEL...
- Publication number 20230197816
- Publication date Jun 22, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF CAVITY SPACER AND SOURCE-DRAIN EPITAXIAL GROWTH FOR SC...
- Publication number 20230197818
- Publication date Jun 22, 2023
- Intel Corporation
- Nitesh Kumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING RAISED WALL ST...
- Publication number 20230197713
- Publication date Jun 22, 2023
- Intel Corporation
- Guillaume BOUCHE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...
- Publication number 20230197838
- Publication date Jun 22, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...
- Publication number 20230197855
- Publication date Jun 22, 2023
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...
- Publication number 20230197854
- Publication date Jun 22, 2023
- Intel Corporation
- Leonard P. GULER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING EPITAXIAL SOUR...
- Publication number 20230197722
- Publication date Jun 22, 2023
- Intel Corporation
- Mohammad HASAN
- H01 - BASIC ELECTRIC ELEMENTS

Mohammad Mehedi Hasan

Person

Patents Grantslast 30 patents

Fabrication of gate-all-around integrated circuit structures having...

Integrated circuit structures with backside gate partial cut or tre...

Integrated circuit structures having metal gates with tapered plugs

High aspect ratio source or drain structures with abrupt dopant pro...

Localized spacer for nanowire transistors and methods of fabrication

Fabrication of gate-all-around integrated circuit structures having...

High aspect ratio source or drain structures with abrupt dopant pro...

Voltage detector with high voltage protection

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC GATE WALL AND DIELE...

INTEGRATED CIRCUIT STRUCTURES WITH BACKSIDE GATE PARTIAL CUT OR TRE...

INTEGRATED CIRCUIT STRUCTURE WITH VARIED SUB-FIN TRENCHES AND EPITA...

INTEGRATED CIRCUIT STRUCTURES HAVING CUT METAL GATES

STACKED CMOS TRANSISTOR STRUCTURES WITH COMPLEMENTARY CHANNEL MATER...

INTEGRATED CIRCUIT STRUCTURES WITH INTERNAL SPACER LINERS

INTEGRATED CIRCUIT STRUCTURES WITH REMOVED SUB-FIN

INTEGRATED CIRCUIT STRUCTURES HAVING CUT METAL GATES

FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING...

INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...

EPITAXIAL STRUCTURE AND GATE METAL STRUCTURES WITH A PLANAR TOP SUR...

INTEGRATED CIRCUIT STRUCTURES WITH UNIFORM EPITAXIAL SOURCE OR DRAI...

HIGH ASPECT RATIO SOURCE OR DRAIN STRUCTURES WITH ABRUPT DOPANT PRO...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING NECKED FEATURE

SOURCE OR DRAIN STRUCTURES WITH SELECTIVE SILICIDE CONTACTS THEREON

GATE CUT STRUCTURES

DEEP ETCH PROCESSING FOR TRANSISTORS HAVING VARYING PITCH

CONDUCTIVE CONTACTS WRAPPED AROUND EPITAXIAL SOURCE OR DRAIN REGIONS

INTEGRATED CIRCUITS WITH GATE PLUGS TO INDUCE COMPRESSIVE CHANNEL S...

FORMATION OF METAL CONTACTS TO SILICON GERMANIUM LAYERS WITH ETCH R...

EPI BARRIER ALIGNED BACKSIDE CONTACT

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...

SRAM WITH CHANNEL COUNT CONTRAST FOR GREATER READ STABILITY

INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATE PLUG LANDED ON DIEL...

FORMATION OF CAVITY SPACER AND SOURCE-DRAIN EPITAXIAL GROWTH FOR SC...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING RAISED WALL ST...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAI...

INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING EPITAXIAL SOUR...