Mohammadreza HAJIAHMADI

Person

Rotterdam, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 12,112,260
- Issue date Oct 8, 2024
- ASML Netherlands B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and associated computer product
- Patent number 12,105,432
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Narjes Javaheri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology parameter determination and metrology recipe selection
- Patent number 11,448,974
- Issue date Sep 20, 2022
- ASML Netherlands B.V.
- Narjes Javaheri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining a value of a parameter of interest of a patte...
- Patent number 11,181,828
- Issue date Nov 23, 2021
- ASML Netherlands B.V.
- Patrick Warnaar
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method, apparatus, and computer program to determine a re...
- Patent number 11,009,345
- Issue date May 18, 2021
- ASML Netherlands B.V.
- Alberto Da Costa Assafrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology parameter determination and metrology recipe selection
- Patent number 10,990,020
- Issue date Apr 27, 2021
- ASML Netherlands B.V.
- Narjes Javaheri
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method, apparatus and computer program
- Patent number 10,794,693
- Issue date Oct 6, 2020
- ASML Netherlands B.V.
- Farzad Farhadzadeh
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 10,705,437
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Narjes Javaheri
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,481,506
- Issue date Nov 19, 2019
- ASML Netherlands B.V.
- Murat Bozkurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology parameter determination and metrology recipe selection
- Patent number 10,451,978
- Issue date Oct 22, 2019
- ASML Netherlands B.V.
- Kaustuve Bhattacharyya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Metrology Apparatus And Method For Determining A Characteristic Of...
- Publication number 20240412067
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE, PATTERNING DEVICE AND METROLOGY APPARATUSES
- Publication number 20230205097
- Publication date Jun 29, 2023
- ASML NETHERLANDS B.V.
- Mattia MARELLI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY METHOD AND ASSOCIATED COMPUTER PRODUCT
- Publication number 20220252990
- Publication date Aug 11, 2022
- ASML Netherlands B,V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
- Publication number 20210208513
- Publication date Jul 8, 2021
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A PATTE...
- Publication number 20200133140
- Publication date Apr 30, 2020
- ASML NETHERLANDS B.V.
- Patrick WARNAAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20200050114
- Publication date Feb 13, 2020
- ASML NETHERLANDS B.V.
- Murat Bozkurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic of...
- Publication number 20190378012
- Publication date Dec 12, 2019
- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Method, Apparatus And Computer Program
- Publication number 20190368867
- Publication date Dec 5, 2019
- ASML NETHERLANDS B.V.
- Alberto DA COSTA ASSAFRAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
- Publication number 20190107785
- Publication date Apr 11, 2019
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method, Apparatus and Computer Program
- Publication number 20190056220
- Publication date Feb 21, 2019
- ASML NETHERLANDS B.V.
- Farzad FARHADZADEH
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
- Publication number 20190004437
- Publication date Jan 3, 2019
- ASML NETHERLANDS B.V.
- Kaustuve Bhattacharyya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
- Publication number 20180321597
- Publication date Nov 8, 2018
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20180321599
- Publication date Nov 8, 2018
- ASML NETHERLANDS B.V.
- Murat BOZKURT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Mohammadreza HAJIAHMADI

Person

Patents Grantslast 30 patents

Metrology apparatus and method for determining a characteristic of...

Metrology method and associated computer product

Metrology parameter determination and metrology recipe selection

Method of determining a value of a parameter of interest of a patte...

Metrology method, apparatus, and computer program to determine a re...

Metrology parameter determination and metrology recipe selection

Metrology method, apparatus and computer program

Metrology method and apparatus, computer program and lithographic s...

Method of measuring a structure, inspection apparatus, lithographic...

Metrology parameter determination and metrology recipe selection

Patents Applicationslast 30 patents

Metrology Apparatus And Method For Determining A Characteristic Of...

SUBSTRATE, PATTERNING DEVICE AND METROLOGY APPARATUSES

METROLOGY METHOD AND ASSOCIATED COMPUTER PRODUCT

METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION

METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A PATTE...

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

Metrology Apparatus and Method for Determining a Characteristic of...

Metrology Method, Apparatus And Computer Program

Metrology Method and Apparatus, Computer Program and Lithographic S...

Metrology Method, Apparatus and Computer Program

METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION

METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION

Method of Measuring a Structure, Inspection Apparatus, Lithographic...