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Mohammed Anjum
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Boise, ID, US
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last 30 patents
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Patent Grant
Contamination free source for shallow low energy junction implants...
Patent number
5,965,932
Issue date
Oct 12, 1999
Micron Technology, Inc.
Gurtej S. Sandhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contamination free source for shallow low energy junction implants
Patent number
5,891,791
Issue date
Apr 6, 1999
Micron Technology, Inc.
Gurtej S. Sandhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Oxidation enhancement in narrow masked field regions of a semicondu...
Patent number
5,358,894
Issue date
Oct 25, 1994
Micron Technology, Inc.
Pierre Fazan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor devices produced according to a method which reduces...
Patent number
5,258,637
Issue date
Nov 2, 1993
Micron Technology, Inc.
Gurtej S. Sandhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of reducing contact resistance at silicide/active area inter...
Patent number
5,108,954
Issue date
Apr 28, 1992
Micron Technology, Inc.
Gurtej S. Sandhu
H01 - BASIC ELECTRIC ELEMENTS