Mohammed Belassel

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Windsor, CA

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Patents Grantslast 30 patents

Information Patent Grant
Mounting system and sample holder for X-ray diffraction apparatus
- Patent number 11,346,794
- Issue date May 31, 2022
- PROTO PATENTS LTD.
- Vedran Nicholas Vukotic
- G01 - MEASURING TESTING
Information Patent Grant
Mounting system and sample holder for X-ray diffraction apparatus
- Patent number 10,794,844
- Issue date Oct 6, 2020
- PROTO MANUFACTURING, LTD.
- Vedran Nicholas Vukotic
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing systems and methods
- Patent number 8,477,905
- Issue date Jul 2, 2013
- Proto Manufacturing Ltd.
- Mohammed Belassel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...
- Publication number 20240060911
- Publication date Feb 22, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
- Publication number 20230273134
- Publication date Aug 31, 2023
- PROTO PATENTS LTD.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING
Information Patent Application
MOUNTING SYSTEM AND SAMPLE HOLDER FOR X-RAY DIFFRACTION APPARATUS
- Publication number 20210055236
- Publication date Feb 25, 2021
- Proto Manufacturing Ltd.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING
Information Patent Application
MOUNTING SYSTEM AND SAMPLE HOLDER FOR X-RAY DIFFRACTION APPARATUS
- Publication number 20190178823
- Publication date Jun 13, 2019
- Proto Manufacturing Ltd.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE TESTING SYSTEMS AND METHODS
- Publication number 20100239068
- Publication date Sep 23, 2010
- Mohammed Belassel
- G01 - MEASURING TESTING