-
Methods for controlling wafer curvature
-
Patent number 8,918,988
-
Issue date Dec 30, 2014
-
International Business Machines Corporation
-
Mohammed Fazil Fayaz
-
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
-
Identifying defects
-
Patent number 8,571,299
-
Issue date Oct 29, 2013
-
International Business Machines Corporation
-
Mohammed F. Fayaz
-
G01 - MEASURING TESTING
-
-
-
-
-
Via density rules
-
Patent number 6,864,171
-
Issue date Mar 8, 2005
-
Infineon Technologies AG
-
Mark D. Hoinkis
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
MIMcap top plate pull-back
-
Patent number 6,693,017
-
Issue date Feb 17, 2004
-
Infineon Technologies AG
-
Mohammed Fazil Fayaz
-
H01 - BASIC ELECTRIC ELEMENTS