TREA

Mohammed S. Shaikh

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  • Essex Junction, VT, US
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    High Performance Compliant Wafer Test Probe
    • Publication number 20120329295
    • Publication date Dec 27, 2012
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING
  • Information Patent Application

    High Performance Compliant Wafer Test Probe
    • Publication number 20110266539
    • Publication date Nov 3, 2011
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING
  • Information Patent Application

    SILICON CHICKLET PEDESTAL
    • Publication number 20110199108
    • Publication date Aug 18, 2011
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING
  • Information Patent Application

    SILICON CHICKLET PEDESTAL
    • Publication number 20110199109
    • Publication date Aug 18, 2011
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING
  • Information Patent Application

    SILICON CHICKLET PEDESTAL
    • Publication number 20110037489
    • Publication date Feb 17, 2011
    • International Business Machines Corporation
    • S. Jay Chey
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONNECTION APPARATUS AND METHOD
    • Publication number 20070201209
    • Publication date Aug 30, 2007
    • Sally Jean Francis
    • G01 - MEASURING TESTING
  • Information Patent Application

    Structure for coupling probes of probe device to corresponding elec...
    • Publication number 20070200572
    • Publication date Aug 30, 2007
    • Ronald Richard Breton
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER TEST SPACE TRANSFORMER
    • Publication number 20050046537
    • Publication date Mar 3, 2005
    • International Business Machines Corporation
    • John F. Hagios
    • G01 - MEASURING TESTING