Mohammed TAHMASSEBPUR

Person

San Ramon, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electron source architecture for a scanning electron microscopy system
- Patent number 10,388,489
- Issue date Aug 20, 2019
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Permanent-magnet particle beam apparatus and method incorporating a...
- Patent number 10,211,021
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for shielding a controlled pressure environment
- Patent number 9,879,684
- Issue date Jan 30, 2018
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for gas flow mitigation of molecular contaminatio...
- Patent number 9,874,512
- Issue date Jan 23, 2018
- KLA-Tencor Corporation
- Gildardo Delgado
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron-optical system for high-speed and high-sensitivity inspect...
- Patent number 8,664,594
- Issue date Mar 4, 2014
- KLA-Tencor Corporation
- Xinrong Jiang
- G01 - MEASURING TESTING
Information Patent Grant
High-vacuum variable aperture mechanism and method of using same
- Patent number 8,278,623
- Issue date Oct 2, 2012
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic chuck
- Patent number 8,169,768
- Issue date May 1, 2012
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielding, particulate reducing high vacuum components
- Patent number 8,092,927
- Issue date Jan 10, 2012
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Shielding, particulate reducing high vacuum components
- Patent number 7,919,193
- Issue date Apr 5, 2011
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Patents Applicationslast 30 patents

Information Patent Application
Electron Source Architecture for a Scanning Electron Microscopy System
- Publication number 20180240640
- Publication date Aug 23, 2018
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PERMANENT-MAGNET PARTICLE BEAM APPARATUS AND METHOD INCORPORATING A...
- Publication number 20170294286
- Publication date Oct 12, 2017
- KLA-Tencor Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GAS FLOW MITIGATION OF MOLECULAR CONTAMINATIO...
- Publication number 20140362366
- Publication date Dec 11, 2014
- Gildardo Delgado
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Cleaning Optical Surfaces of an Extreme Ultra...
- Publication number 20140261568
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Gildardo Delgado
- B08 - CLEANING
Information Patent Application
APPARATUS AND METHOD FOR SHIELDING A CONTROLLED PRESSURE ENVIRONMENT
- Publication number 20140072452
- Publication date Mar 13, 2014
- Mohammed Tahmassebpur
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
High-Vacuum Variable Aperture Mechanism And Method Of Using Same
- Publication number 20120181444
- Publication date Jul 19, 2012
- Mohammed TAHMASSEBPUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shielding, Particulate Reducing High Vacuum Components
- Publication number 20110142382
- Publication date Jun 16, 2011
- KLA-Tencor Technologies Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Mohammed TAHMASSEBPUR

Person

Patents Grantslast 30 patents

Electron source architecture for a scanning electron microscopy system

Permanent-magnet particle beam apparatus and method incorporating a...

Apparatus and method for shielding a controlled pressure environment

Method and system for gas flow mitigation of molecular contaminatio...

Electron-optical system for high-speed and high-sensitivity inspect...

High-vacuum variable aperture mechanism and method of using same

Electrostatic chuck

Shielding, particulate reducing high vacuum components

Shielding, particulate reducing high vacuum components

Patents Applicationslast 30 patents

Electron Source Architecture for a Scanning Electron Microscopy System

PERMANENT-MAGNET PARTICLE BEAM APPARATUS AND METHOD INCORPORATING A...

METHOD AND SYSTEM FOR GAS FLOW MITIGATION OF MOLECULAR CONTAMINATIO...

System and Method for Cleaning Optical Surfaces of an Extreme Ultra...

APPARATUS AND METHOD FOR SHIELDING A CONTROLLED PRESSURE ENVIRONMENT

High-Vacuum Variable Aperture Mechanism And Method Of Using Same

Shielding, Particulate Reducing High Vacuum Components