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Mokuji Kageyama
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Etching method, etching apparatus and analyzing method
Patent number
6,274,505
Issue date
Aug 14, 2001
Kabushiki Kaisha Toshiba
Shoko Ito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and its manufacturing method
Patent number
6,165,872
Issue date
Dec 26, 2000
Kabushiki Kaisha Toshiba
Mokuji Kageyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device and methods of process...
Patent number
6,037,270
Issue date
Mar 14, 2000
Kabushiki Kaisha Toshiba
Mokuji Kageyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and its manufacturing method
Patent number
5,939,770
Issue date
Aug 17, 1999
Kabushiki Kaisha Toshiba
Mokuji Kageyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of producing the same
Patent number
5,574,307
Issue date
Nov 12, 1996
Kabushiki Kaisha Toshiba
Mokuji Kageyama
C30 - CRYSTAL GROWTH
Information
Patent Grant
Semiconductor treatment apparatus
Patent number
5,395,446
Issue date
Mar 7, 1995
Kabushiki Kaisha Toshiba
Mokuji Kageyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting defect on semiconductor substrat...
Patent number
5,271,796
Issue date
Dec 21, 1993
Kabushiki Kaisha Toshiba
Moriya Miyashita
C30 - CRYSTAL GROWTH
Information
Patent Grant
System for analyzing metal impurity on the surface of a single crys...
Patent number
5,148,457
Issue date
Sep 15, 1992
Kabushiki Kaisha Toshiba
Atsuko Kubota
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring impurities in oxide films using a meltable samp...
Patent number
5,055,413
Issue date
Oct 8, 1991
Kabushiki Kaisha Toshiba
Mokuji Kageyama
G01 - MEASURING TESTING
Information
Patent Grant
Impurity measuring method
Patent number
4,990,459
Issue date
Feb 5, 1991
Kabushiki Kaisha Toshiba
Ayako Maeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20160071726
Publication date
Mar 10, 2016
Kabushiki Kaisha Toshiba
Hiroshi MIZUNO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20160027833
Publication date
Jan 28, 2016
Kabushiki Kaisha Toshiba
Masaaki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE FOR SEMICONDUCTOR DEVICES, METHOD OF MANUFACTURING SUBSTR...
Publication number
20150263212
Publication date
Sep 17, 2015
KABUSHIKI KAISHA TOSHIBA
Shinji UYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20150221593
Publication date
Aug 6, 2015
Kabushiki Kaisha Toshiba
Masaaki YAMAMOTO
H01 - BASIC ELECTRIC ELEMENTS