Momoyo Enyama

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 12,205,790
- Issue date Jan 21, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,125,667
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inspection method
- Patent number 12,057,288
- Issue date Aug 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,967,482
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam application apparatus
- Patent number 11,915,903
- Issue date Feb 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam observation device, electron beam observation system,...
- Patent number 11,791,130
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Koichi Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing system and information processing method
- Patent number 11,334,761
- Issue date May 17, 2022
- Hitachi, Ltd.
- Thantip Krasienapibal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope
- Patent number 11,251,011
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam application apparatus
- Patent number 11,177,108
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam observation device, electron beam observation system,...
- Patent number 11,170,969
- Issue date Nov 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Koichi Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,087,947
- Issue date Aug 10, 2021
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming apparatus
- Patent number 10,755,396
- Issue date Aug 25, 2020
- Hitachi, Ltd.
- Momoyo Enyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 10,651,004
- Issue date May 12, 2020
- Hitachi, Ltd.
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and sample inspection method
- Patent number 10,629,405
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and image processing apparatus
- Patent number 10,483,083
- Issue date Nov 19, 2019
- Hitachi, Ltd.
- Thantip Krasienapibal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle detector and charged particle beam device using th...
- Patent number 10,361,063
- Issue date Jul 23, 2019
- Hitachi, Ltd.
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,319,562
- Issue date Jun 11, 2019
- Hitachi, Ltd.
- Megumi Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,256,068
- Issue date Apr 9, 2019
- Hitachi, Ltd.
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,037,866
- Issue date Jul 31, 2018
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and aberration corrector
- Patent number 9,991,088
- Issue date Jun 5, 2018
- Hitachi, Ltd.
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam application device
- Patent number 9,704,687
- Issue date Jul 11, 2017
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle-beam device
- Patent number 9,653,256
- Issue date May 16, 2017
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,384,940
- Issue date Jul 5, 2016
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam applied apparatus, and irradiation method
- Patent number 8,907,278
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,592,776
- Issue date Nov 26, 2013
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 8,552,373
- Issue date Oct 8, 2013
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam applied apparatus
- Patent number 8,350,214
- Issue date Jan 8, 2013
- Hitachi High-Technologies Corporation
- Hiroki Otaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam apparatus and specimen inspection method
- Patent number 8,330,103
- Issue date Dec 11, 2012
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20250020604
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20230305281
- Publication date Sep 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeshi MORIMOTO
- G02 - OPTICS
Information Patent Application
ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD
- Publication number 20230071801
- Publication date Mar 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220359149
- Publication date Nov 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Makoto SAKAKIBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220359150
- Publication date Nov 10, 2022
- Hitachi High-Tech Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Inspection Method
- Publication number 20220328279
- Publication date Oct 13, 2022
- Hitachi High-Tech Corporation
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220328281
- Publication date Oct 13, 2022
- Hitachi High-Tech Corporation
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20220319798
- Publication date Oct 6, 2022
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220102105
- Publication date Mar 31, 2022
- Hitachi High-Tech Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Observation Device, Electron Beam Observation System,...
- Publication number 20220051868
- Publication date Feb 17, 2022
- Hitachi High-Tech Corporation
- Koichi HAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM,...
- Publication number 20210125806
- Publication date Apr 29, 2021
- Hitachi High-Technologies Corporation
- Koichi HAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPLICATION APPARATUS
- Publication number 20210005417
- Publication date Jan 7, 2021
- Hitachi High-Tech Corporation
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20200303152
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD
- Publication number 20200257937
- Publication date Aug 13, 2020
- Hitachi, Ltd
- Thantip KRASIENAPIBAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING SYSTEM
- Publication number 20200225175
- Publication date Jul 16, 2020
- Hitachi, Ltd
- Akiko KAGATSUME
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM DEVICE AND SAMPLE INSPECTION METHOD
- Publication number 20190287757
- Publication date Sep 19, 2019
- Hitachi, Ltd
- Yasunari SOHDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20190131104
- Publication date May 2, 2019
- Hitachi, Ltd
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND IMAGE PROCESSING APPARATUS
- Publication number 20190035597
- Publication date Jan 31, 2019
- Hitachi, Ltd
- Thantip KRASIENAPIBAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20180261426
- Publication date Sep 13, 2018
- Hitachi, Ltd
- Megumi KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Detector and Charged Particle Beam Device Using th...
- Publication number 20180261425
- Publication date Sep 13, 2018
- Hitachi, Ltd
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20180232869
- Publication date Aug 16, 2018
- Hitachi, Ltd
- Momoyo ENYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180033587
- Publication date Feb 1, 2018
- Hitachi, Ltd
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Aberration Corrector
- Publication number 20180025886
- Publication date Jan 25, 2018
- Hitachi, Ltd
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170025251
- Publication date Jan 26, 2017
- Hitachi High-Technologies Corporation
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device
- Publication number 20160300690
- Publication date Oct 13, 2016
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPLICATION DEVICE
- Publication number 20150364290
- Publication date Dec 17, 2015
- Hitachi High-Technologies Corporation
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150294833
- Publication date Oct 15, 2015
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPLIED APPARATUS, AND IRRADIATION METHOD
- Publication number 20130299697
- Publication date Nov 14, 2013
- Hitachi High-Technologies Corporation
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS

Momoyo Enyama

Person

Patents Grantslast 30 patents

Charged particle beam device

Electron gun and electron beam application apparatus

Charged particle beam device

Charged particle beam device and inspection method

Charged particle beam device

Electron beam application apparatus

Electron beam observation device, electron beam observation system,...

Measurement system and method for setting observation conditions of...

Information processing system and information processing method

Electron microscope

Charged particle beam application apparatus

Electron beam observation device, electron beam observation system,...

Electron microscope

Image forming apparatus

Charged particle beam device

Electron beam device and sample inspection method

Scanning electron microscope and image processing apparatus

Charged particle detector and charged particle beam device using th...

Charged particle beam device

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam device and aberration corrector

Charged particle beam application device

Charged particle-beam device

Charged particle beam apparatus

Charged particle beam applied apparatus, and irradiation method

Charged particle beam apparatus

Charged particle beam device and sample observation method

Charged particle beam applied apparatus

Charged particle beam apparatus and specimen inspection method

Patents Applicationslast 30 patents

PHOTOELECTRON EMISSION MICROSCOPE

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

PHOTOELECTRON EMISSION MICROSCOPE

ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device and Inspection Method

CHARGED PARTICLE BEAM DEVICE

ELECTRON BEAM APPLICATION APPARATUS

CHARGED PARTICLE BEAM DEVICE

Electron Beam Observation Device, Electron Beam Observation System,...

Measurement System and Method for Setting Observation Conditions of...

ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM,...

CHARGED PARTICLE BEAM APPLICATION APPARATUS

ELECTRON MICROSCOPE

INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD

ANALYZING SYSTEM

ELECTRON BEAM DEVICE AND SAMPLE INSPECTION METHOD

CHARGED PARTICLE BEAM DEVICE

SCANNING ELECTRON MICROSCOPE AND IMAGE PROCESSING APPARATUS

CHARGED PARTICLE BEAM DEVICE

Charged Particle Detector and Charged Particle Beam Device Using th...

IMAGE FORMING APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device and Aberration Corrector

CHARGED PARTICLE BEAM APPARATUS

Charged-Particle-Beam Device

CHARGED PARTICLE BEAM APPLICATION DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPLIED APPARATUS, AND IRRADIATION METHOD