Morgan A. Crouch

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Active damper for semiconductor metrology and inspection systems
- Patent number 11,280,381
- Issue date Mar 22, 2022
- Onto Innovation Inc.
- Paul A. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
FOUP purge shield
- Patent number 10,784,136
- Issue date Sep 22, 2020
- Onto Innovation Inc.
- Paul A. Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Local purge within metrology and inspection systems
- Patent number 10,451,542
- Issue date Oct 22, 2019
- Nanometrics Incorporated
- Paul A. Doyle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ACTIVE DAMPER FOR SEMICONDUCTOR METROLOGY AND INSPECTION SYSTEMS
- Publication number 20200370619
- Publication date Nov 26, 2020
- ONTO INNOVATION INC.
- Paul A. DOYLE
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
FOUP PURGE SHIELD
- Publication number 20200035531
- Publication date Jan 30, 2020
- Nanometrics Incorporated
- Paul A. DOYLE
- B08 - CLEANING
Information Patent Application
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
- Publication number 20200011786
- Publication date Jan 9, 2020
- Nanometrics Incorporated
- Paul A. DOYLE
- G01 - MEASURING TESTING
Information Patent Application
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
- Publication number 20190170634
- Publication date Jun 6, 2019
- Nanometrics Incorporated
- Paul A. DOYLE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY