Morihiko Hamada

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card, having cantilever-type probe and method
- Patent number 7,256,591
- Issue date Aug 14, 2007
- Fujitsu Limited
- Tsutomu Tatematsu
- G01 - MEASURING TESTING
Information Patent Grant
Self-testing circuit in semiconductor memory device
- Patent number 7,171,592
- Issue date Jan 30, 2007
- Fujitsu Limited
- Kenji Togashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor testing apparatus for conducting conduction tests
- Patent number 6,765,401
- Issue date Jul 20, 2004
- Fujitsu Limited
- Morihiko Hamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor testing apparatus
- Publication number 20030222670
- Publication date Dec 4, 2003
- FUJITSU LIMITED
- Morihiko Hamada
- G01 - MEASURING TESTING
Information Patent Application
Self-testing circuit in semiconductor memory device
- Publication number 20030177415
- Publication date Sep 18, 2003
- FUJITSU LIMITED
- Kenji Togashi
- G11 - INFORMATION STORAGE
Information Patent Application
Probe card and probe contact method
- Publication number 20030098702
- Publication date May 29, 2003
- FUJITSU LIMITED
- Tsutomu Tatematsu
- G01 - MEASURING TESTING
Information Patent Application
Probe card, semiconductor device testing apparatus, and probe conta...
- Publication number 20030098701
- Publication date May 29, 2003
- FUJITSU LIMITED
- Tsutomu Tatematsu
- G01 - MEASURING TESTING