Morimasa Miyazaki

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating quality of semiconductor substrate and method...
- Patent number 7,517,706
- Issue date Apr 14, 2009
- Sumco Corporation
- Morimasa Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor substrate and method of evalu...
- Patent number 7,479,204
- Issue date Jan 20, 2009
- Sumco Corporation
- Morimasa Miyazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING QUALITY OF SEMICONDUCTOR SUBSTRATE AND METHOD...
- Publication number 20080020497
- Publication date Jan 24, 2008
- SUMCO CORPORATION
- Morimasa Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE AND METHOD OF EVALU...
- Publication number 20070193686
- Publication date Aug 23, 2007
- SUMCO CORPORATION
- Morimasa MIYAZAKI
- G01 - MEASURING TESTING