Morio Ishihara

Person

Osaka-fu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for time-of-flight mass spectrometry
- Patent number 8,237,112
- Issue date Aug 7, 2012
- Jeol Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for time-of-flight mass spectrometry
- Patent number 7,910,879
- Issue date Mar 22, 2011
- Jeol Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for time-of-flight mass spectrometry
- Patent number 7,504,620
- Issue date Mar 17, 2009
- Jeol Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer
- Patent number 7,227,131
- Issue date Jun 5, 2007
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,211,792
- Issue date May 1, 2007
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer
- Patent number 7,148,473
- Issue date Dec 12, 2006
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining mass-to-charge ratio of ions and mass spectro...
- Patent number 7,091,480
- Issue date Aug 15, 2006
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,038,198
- Issue date May 2, 2006
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of multi-turn time-of-flight mass analysis
- Patent number 6,949,736
- Issue date Sep 27, 2005
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of determining mass-to-charge ratio of...
- Patent number 6,949,738
- Issue date Sep 27, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 6,300,625
- Issue date Oct 9, 2001
- Jeol, Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and mass spectrometric method sing...
- Patent number 6,160,256
- Issue date Dec 12, 2000
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 6,057,544
- Issue date May 2, 2000
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing mass spectrum
- Patent number 5,900,628
- Issue date May 4, 1999
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous detection type mass spectrometer
- Patent number 5,118,939
- Issue date Jun 2, 1992
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous detection type mass spectrometer
- Patent number 5,107,110
- Issue date Apr 21, 1992
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic multipole lens for charged-particle beam
- Patent number 5,051,593
- Issue date Sep 24, 1991
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer capable of multiple simultaneous detection
- Patent number 4,998,015
- Issue date Mar 5, 1991
- Jeol Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Time-of-Flight Mass Spectrometry
- Publication number 20110133073
- Publication date Jun 9, 2011
- JEOL Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Time-of-Flight Mass Spectrometry
- Publication number 20090212208
- Publication date Aug 27, 2009
- JEOL Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for time-of-flight mass spectrometry
- Publication number 20070194223
- Publication date Aug 23, 2007
- JEOL, LTD
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of flight mass spectrometer
- Publication number 20050194528
- Publication date Sep 8, 2005
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20050151076
- Publication date Jul 14, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer and method of determining mass-to-charge ratio of...
- Publication number 20050103992
- Publication date May 19, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of multi-turn time-of-flight mass analysis
- Publication number 20050092913
- Publication date May 5, 2005
- JEOL Ltd.
- Morio Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20050077461
- Publication date Apr 14, 2005
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of determining mass-to-charge ratio of ions and mass spectro...
- Publication number 20050077462
- Publication date Apr 14, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of flight mass spectrometer
- Publication number 20050045817
- Publication date Mar 3, 2005
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Morio Ishihara

Person

Patents Grantslast 30 patents

Method and apparatus for time-of-flight mass spectrometry

Method and apparatus for time-of-flight mass spectrometry

Method and apparatus for time-of-flight mass spectrometry

Time of flight mass spectrometer

Mass spectrometer

Time of flight mass spectrometer

Method of determining mass-to-charge ratio of ions and mass spectro...

Mass spectrometer

Method of multi-turn time-of-flight mass analysis

Mass spectrometer and method of determining mass-to-charge ratio of...

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer and mass spectrometric method sing...

Mass spectrometer

Method of processing mass spectrum

Simultaneous detection type mass spectrometer

Simultaneous detection type mass spectrometer

Electrostatic multipole lens for charged-particle beam

Mass spectrometer capable of multiple simultaneous detection

Patents Applicationslast 30 patents

Method and Apparatus for Time-of-Flight Mass Spectrometry

Method and Apparatus for Time-of-Flight Mass Spectrometry

Method and apparatus for time-of-flight mass spectrometry

Time of flight mass spectrometer

Mass spectrometer

Mass spectrometer and method of determining mass-to-charge ratio of...

Method of multi-turn time-of-flight mass analysis

Mass spectrometer

Method of determining mass-to-charge ratio of ions and mass spectro...

Time of flight mass spectrometer