Membership
Tour
Register
Log in
Morioki Kubozoe
Follow
Person
Hitachinaka, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Bi-axial-tilting specimen fine motion device and method of correcti...
Patent number
5,591,980
Issue date
Jan 7, 1997
Hitachi, Ltd.
Mitsuo Ogasawara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope
Patent number
5,350,918
Issue date
Sep 27, 1994
Hitachi, Ltd.
Sadao Terakado
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron lens assembly
Patent number
4,806,767
Issue date
Feb 21, 1989
Hitachi, Ltd.
Morioki Kubozoe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focusing apparatus used in a transmission electron microscope
Patent number
4,698,503
Issue date
Oct 6, 1987
Hitachi, Ltd.
Setsuo Nomura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image distortion-free, image rotation-free electron microscope
Patent number
4,494,000
Issue date
Jan 15, 1985
Hitachi, Ltd.
Kazuo Shii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron energy analyzing apparatus
Patent number
4,480,220
Issue date
Oct 30, 1984
Hitachi, Ltd.
Shigeto Isakozawa
G01 - MEASURING TESTING
Information
Patent Grant
Electron microscope equipped with measuring facility
Patent number
4,468,560
Issue date
Aug 28, 1984
Hitachi, Ltd.
Morioki Kubozoe
G01 - MEASURING TESTING
Information
Patent Grant
Electron microscope
Patent number
4,121,100
Issue date
Oct 17, 1978
Hitachi, Ltd.
Morioki Kubozoe
H01 - BASIC ELECTRIC ELEMENTS