Moritz-Andreas Meyer

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Metal line layout based on line shifting
- Patent number 9,898,572
- Issue date Feb 20, 2018
- GLOBALFOUNDRIES Inc.
- Thomas Melde
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method comprising applying an external mechanical stress to a semic...
- Patent number 9,281,252
- Issue date Mar 8, 2016
- GLOBALFOUNDRIES Inc.
- Alexander Würfel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Technique for forming metal lines in a semiconductor by adapting th...
- Patent number 8,575,029
- Issue date Nov 5, 2013
- Advanced Micro Devices, Inc.
- Moritz Andreas Meyer
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of forming an alloy in an interconnect structure to increase...
- Patent number 8,329,577
- Issue date Dec 11, 2012
- GLOBALFOUNDRIES Inc.
- Matthias Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of testing an integrity of a material layer in a semiconduct...
- Patent number 8,058,081
- Issue date Nov 15, 2011
- Advanced Micro Devices, Inc.
- Moritz Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for forming metal lines in a semiconductor by adapting th...
- Patent number 8,058,731
- Issue date Nov 15, 2011
- Advanced Micro Devices, Inc.
- Moritz Andreas Meyer
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Technique for forming embedded metal lines having increased resista...
- Patent number 8,039,395
- Issue date Oct 18, 2011
- GLOBALFOUNDRIES Inc.
- Moritz-Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for estimating the crystallinity of stacked metal...
- Patent number 7,718,447
- Issue date May 18, 2010
- Advanced Micro Devices, Inc.
- Inka Zienert
- G01 - MEASURING TESTING
Information Patent Grant
Technique for CD measurement on the basis of area fraction determin...
- Patent number 7,335,880
- Issue date Feb 26, 2008
- Advanced Micro Devices, Inc.
- Eckhard Langer
- G01 - MEASURING TESTING
Information Patent Grant
Technique for monitoring the state of metal lines in microstructures
- Patent number 6,953,755
- Issue date Oct 11, 2005
- Advanced Micro Devices, Inc.
- Moritz Andreas Meyer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METAL LINE LAYOUT BASED ON LINE SHIFTING
- Publication number 20170235867
- Publication date Aug 17, 2017
- GLOBALFOUNDRIES INC.
- Thomas Melde
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR FORMING METAL LINES IN A SEMICONDUCTOR BY ADAPTING TH...
- Publication number 20120088365
- Publication date Apr 12, 2012
- Advanced Micro Devices, Inc.
- Moritz Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Increasing Electromigration Resistance in an Interconnect Structure...
- Publication number 20110124189
- Publication date May 26, 2011
- GLOBALFOUNDRIES INC.
- Matthias Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCREASING ELECTROMIGRATION RESISTANCE IN AN INTERCONNECT STRUCTURE...
- Publication number 20090197408
- Publication date Aug 6, 2009
- Matthias Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUE FOR FORMING METAL LINES IN A SEMICONDUCTOR BY ADAPTING TH...
- Publication number 20080268265
- Publication date Oct 30, 2008
- Moritz Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING AN INTEGRITY OF A MATERIAL LAYER IN A SEMICONDUCT...
- Publication number 20080160654
- Publication date Jul 3, 2008
- Moritz Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ESTIMATING THE CRYSTALLINITY OF STACKED METAL...
- Publication number 20070201615
- Publication date Aug 30, 2007
- Inka Zienert
- G01 - MEASURING TESTING
Information Patent Application
Technique for CD measurement on the basis of area fraction determin...
- Publication number 20060219906
- Publication date Oct 5, 2006
- Eckhard Langer
- G01 - MEASURING TESTING
Information Patent Application
Technique for forming embedded metal lines having increased resista...
- Publication number 20050161817
- Publication date Jul 28, 2005
- Moritz-Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for monitoring the state of metal lines in microstructures
- Publication number 20050072919
- Publication date Apr 7, 2005
- Moritz Andreas Meyer
- G01 - MEASURING TESTING

Moritz-Andreas Meyer

Person

Patents Grantslast 30 patents

Metal line layout based on line shifting

Method comprising applying an external mechanical stress to a semic...

Technique for forming metal lines in a semiconductor by adapting th...

Method of forming an alloy in an interconnect structure to increase...

Method of testing an integrity of a material layer in a semiconduct...

Technique for forming metal lines in a semiconductor by adapting th...

Technique for forming embedded metal lines having increased resista...

System and method for estimating the crystallinity of stacked metal...

Technique for CD measurement on the basis of area fraction determin...

Technique for monitoring the state of metal lines in microstructures

Patents Applicationslast 30 patents

METAL LINE LAYOUT BASED ON LINE SHIFTING

TECHNIQUE FOR FORMING METAL LINES IN A SEMICONDUCTOR BY ADAPTING TH...

Increasing Electromigration Resistance in an Interconnect Structure...

INCREASING ELECTROMIGRATION RESISTANCE IN AN INTERCONNECT STRUCTURE...

TECHNIQUE FOR FORMING METAL LINES IN A SEMICONDUCTOR BY ADAPTING TH...

METHOD OF TESTING AN INTEGRITY OF A MATERIAL LAYER IN A SEMICONDUCT...

SYSTEM AND METHOD FOR ESTIMATING THE CRYSTALLINITY OF STACKED METAL...

Technique for CD measurement on the basis of area fraction determin...

Technique for forming embedded metal lines having increased resista...

Technique for monitoring the state of metal lines in microstructures