Morteza M. Chamran deceased

Person

late of Elmhurst, IL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic wavelength calibration apparatus
- Patent number 4,681,444
- Issue date Jul 21, 1987
- The Perkin-Elmer Corporation
- Alan C. Ferber
- G01 - MEASURING TESTING
Information Patent Grant
Wide dynamic range linear to log converter with microcomputer control
- Patent number 4,679,162
- Issue date Jul 7, 1987
- Perkin-Elmer Corp.
- Morteza M. Chamran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automatic shutter system
- Patent number 4,647,199
- Issue date Mar 3, 1987
- The Perkin-Elmer Corporation
- Alan C. Ferber
- G02 - OPTICS
Information Patent Grant
Analog-to-digital converter having programmable dynamic range
- Patent number 4,644,323
- Issue date Feb 17, 1987
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase-locked timing system for a spectrophotometer
- Patent number 4,644,485
- Issue date Feb 17, 1987
- The Perkin-Elmer Corporation
- Alan C. Ferber
- G02 - OPTICS
Information Patent Grant
Current control system for spectrophotometers
- Patent number 4,643,571
- Issue date Feb 17, 1987
- The Perkin-Elmer Corporation
- Alan C. Ferber
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometers
- Patent number 4,616,210
- Issue date Oct 7, 1986
- The Perkin-Elmer Corporation
- Alan C. Ferber
- G01 - MEASURING TESTING
Information Patent Grant
Lamp firing apparatus
- Patent number 4,417,180
- Issue date Nov 22, 1983
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Photodetector arrangements and circuits
- Patent number RE31350
- Issue date Aug 16, 1983
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- 250 - Radiant energy
Information Patent Grant
Filter indexing for spectrophotometer system
- Patent number 4,342,516
- Issue date Aug 3, 1982
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer system having power line synchronization
- Patent number 4,332,470
- Issue date Jun 1, 1982
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer improvement of improved automatic wavelength inde...
- Patent number 4,329,051
- Issue date May 11, 1982
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING
Information Patent Grant
Safe memory system for a spectrophotometer
- Patent number 4,322,807
- Issue date Mar 30, 1982
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING
Information Patent Grant
Manual wavelength adjustment for a microprocessor based spectrophot...
- Patent number 4,318,616
- Issue date Mar 9, 1982
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector arrangements and circuits
- Patent number 4,223,215
- Issue date Sep 16, 1980
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for calibrating instruments
- Patent number 4,037,154
- Issue date Jul 19, 1977
- The Perkin-Elmer Corporation
- Morteza M. Chamran
- G01 - MEASURING TESTING

Morteza M. Chamran deceased

Person

Patents Grantslast 30 patents

Automatic wavelength calibration apparatus

Wide dynamic range linear to log converter with microcomputer control

Automatic shutter system

Analog-to-digital converter having programmable dynamic range

Phase-locked timing system for a spectrophotometer

Current control system for spectrophotometers

Spectrophotometers

Lamp firing apparatus

Photodetector arrangements and circuits

Filter indexing for spectrophotometer system

Spectrophotometer system having power line synchronization

Spectrophotometer improvement of improved automatic wavelength inde...

Safe memory system for a spectrophotometer

Manual wavelength adjustment for a microprocessor based spectrophot...

Photodetector arrangements and circuits

Circuit for calibrating instruments