Moshe Beylin

Follow

Person

Nahariya, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of X-ray reflectometry measurement locations
- Publication number 20070274447
- Publication date Nov 29, 2007
- Isaac Mazor
- G01 - MEASURING TESTING