Moshe Edri

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Kiryat Tivon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor edge and bevel inspection tool system
- Patent number 11,927,545
- Issue date Mar 12, 2024
- Camtek Ltd.
- Carmel Yehuda Drillman
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 11,828,713
- Issue date Nov 28, 2023
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSP...
- Publication number 20240003826
- Publication date Jan 4, 2024
- CAMTEK LTD
- Carmel Yehuda DRILLMAN
- H01 - BASIC ELECTRIC ELEMENTS