Moshe ELIASOF

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Givatayim, IL

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Patents Grantslast 30 patents

Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220082376
- Publication date Mar 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- H01 - BASIC ELECTRIC ELEMENTS