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Moshe Langer
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Nes-Ziona, IL
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for performing active distance measurements
Patent number
11,668,830
Issue date
Jun 6, 2023
VayaVision Sensing Ltd.
Youval Nehmadi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Managing a change in a physical property of a vehicle due to an ext...
Patent number
11,292,483
Issue date
Apr 5, 2022
VayaVision Sensing, Ltd.
Youval Nehmadi
B60 - VEHICLES IN GENERAL
Information
Patent Grant
High electron energy based overlay error measurement methods and sy...
Patent number
9,046,475
Issue date
Jun 2, 2015
Applied Materials Israel, Ltd.
Moshe Langer
G01 - MEASURING TESTING
Information
Patent Grant
High resolution wafer inspection system
Patent number
7,973,919
Issue date
Jul 5, 2011
Applied Materials Israel, Ltd.
Dan Grossman
G01 - MEASURING TESTING
Information
Patent Grant
High resolution wafer inspection system
Patent number
7,714,999
Issue date
May 11, 2010
Applied Materials Israel, Ltd.
Dan Grossman
G01 - MEASURING TESTING
Information
Patent Grant
Probe card and a method for detecting defects using a probe card an...
Patent number
7,518,391
Issue date
Apr 14, 2009
Applied Materials, Israel, Ltd.
Moshe Langer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR PERFORMING ACTIVE DISTANCEMEASUREMENTS
Publication number
20230266472
Publication date
Aug 24, 2023
VAYAVISION SENSING LTD.
Youval Nehmadi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MANAGING A CHANGE IN A PHYSICAL PROPERTY OF A VEHICLE DUE TO AN EXT...
Publication number
20200062273
Publication date
Feb 27, 2020
Youval Nehmadi
B60 - VEHICLES IN GENERAL
Information
Patent Application
HIGH ELECTRON ENERGY BASED OVERLAY ERROR MEASUREMENT METHODS AND SY...
Publication number
20120292502
Publication date
Nov 22, 2012
Moshe Langer
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
Publication number
20100188658
Publication date
Jul 29, 2010
Dan Grossman
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
Publication number
20080231845
Publication date
Sep 25, 2008
Dan Grossman
G01 - MEASURING TESTING
Information
Patent Application
Probe card and a method for detecting defects using a probe card an...
Publication number
20050278134
Publication date
Dec 15, 2005
Moshe Langer
G01 - MEASURING TESTING