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Moshe Markowitz
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Haifa, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Systems for providing illumination in optical metrology
Patent number
10,203,247
Issue date
Feb 12, 2019
KLA-Tencor Corporation
Gregory R. Brady
F21 - LIGHTING
Information
Patent Grant
Systems for providing illumination in optical metrology
Patent number
9,512,985
Issue date
Dec 6, 2016
KLA-Tencor Corporation
Gregory R. Brady
G02 - OPTICS
Information
Patent Grant
Metrology systems and methods
Patent number
9,080,971
Issue date
Jul 14, 2015
KLA-Tencor Corp.
Daniel Kandel
G01 - MEASURING TESTING
Information
Patent Grant
Metrology systems and methods
Patent number
8,873,054
Issue date
Oct 28, 2014
KLA-Tencor Corp.
Daniel Kandel
G01 - MEASURING TESTING
Information
Patent Grant
Metrology systems and methods
Patent number
8,441,639
Issue date
May 14, 2013
KLA-Tencor Corp.
Daniel Kandel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Systems for Providing Illumination in Optical Metrology
Publication number
20170146399
Publication date
May 25, 2017
KLA-Tencor Corporation
Gregory R. Brady
G02 - OPTICS
Information
Patent Application
Metrology Systems and Methods
Publication number
20150036142
Publication date
Feb 5, 2015
KLA-Tencor Corporation
Daniel Kandel
G01 - MEASURING TESTING
Information
Patent Application
Systems for Providing Illumination in Optical Metrology
Publication number
20140240951
Publication date
Aug 28, 2014
KLA-Tencor Corporation
Gregory R. Brady
G02 - OPTICS
Information
Patent Application
Metrology Systems and Methods
Publication number
20130229661
Publication date
Sep 5, 2013
KLA-Tencor Corporation
Daniel Kandel
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY SYSTEMS AND METHODS
Publication number
20110069312
Publication date
Mar 24, 2011
KLA-Tencor Corporation
Daniel Kandel
G01 - MEASURING TESTING