Moshe ROSENWEIG

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 12,183,066
- Issue date Dec 31, 2024
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,205,119
- Issue date Dec 21, 2021
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for design based inspection
- Patent number 10,229,241
- Issue date Mar 12, 2019
- Applied Materials Israel Ltd.
- Ziv Parizat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for design based inspection
- Patent number 10,055,534
- Issue date Aug 21, 2018
- Applied Materials Israel Ltd.
- Ziv Parizat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for patch based inspection
- Patent number 9,904,995
- Issue date Feb 27, 2018
- Applied Materials Israel, Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20220067523
- Publication date Mar 3, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DESIGN BASED INSPECTION
- Publication number 20180357357
- Publication date Dec 13, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ziv PARIZAT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20170364798
- Publication date Dec 21, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170357895
- Publication date Dec 14, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DESIGN BASED INSPECTION
- Publication number 20170270232
- Publication date Sep 21, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Ziv PARIZAT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170177997
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PATCH BASED INSPECTION
- Publication number 20170169554
- Publication date Jun 15, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING

Moshe ROSENWEIG

Person

Patents Grantslast 30 patents

Method of deep learning-based examination of a semiconductor specim...

Method of deep learning-based examination of a semiconductor specim...

System and method for design based inspection

System and method for design based inspection

System and method for patch based inspection

Patents Applicationslast 30 patents

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

SYSTEM AND METHOD FOR DESIGN BASED INSPECTION

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

SYSTEM AND METHOD FOR DESIGN BASED INSPECTION

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

SYSTEM AND METHOD FOR PATCH BASED INSPECTION