Mostafa Maazouz

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical alignment correction using convolutional neural network eva...
- Patent number 10,923,318
- Issue date Feb 16, 2021
- FEI Company
- Galen Gledhill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined SEM-CL and FIB-IOE microscopy
- Patent number 10,896,802
- Issue date Jan 19, 2021
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for enhancing SE detection in mirror-based lig...
- Patent number 10,692,694
- Issue date Jun 23, 2020
- FEI Company
- Galen Gledhill
- G02 - OPTICS
Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,691,583
- Issue date Jun 27, 2017
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for optimizing charged particle beams formed by shaped apert...
- Patent number 9,679,742
- Issue date Jun 13, 2017
- FEI Company
- Richard Swinford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam low kV enhancement
- Patent number 9,443,692
- Issue date Sep 13, 2016
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,105,438
- Issue date Aug 11, 2015
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam low kV enhancement
- Patent number 9,087,672
- Issue date Jul 21, 2015
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam low kV enhancement
- Patent number 8,933,414
- Issue date Jan 13, 2015
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused charged particle column for operation at different beam ene...
- Patent number 8,742,361
- Issue date Jun 3, 2014
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-chamber electron detector
- Patent number 8,164,059
- Issue date Apr 24, 2012
- FEI Company
- Robert Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20240429018
- Publication date Dec 26, 2024
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...
- Publication number 20230411109
- Publication date Dec 21, 2023
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20230095798
- Publication date Mar 30, 2023
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL ALIGNMENT CORRECTION USING CONVOLUTIONAL NEURAL NETWORK EVA...
- Publication number 20200203122
- Publication date Jun 25, 2020
- FEI Company
- Galen Gledhill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED SEM-CL AND FIB-IOE MICROSCOPY
- Publication number 20190198288
- Publication date Jun 27, 2019
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES
- Publication number 20190198289
- Publication date Jun 27, 2019
- FEI Company
- Galen Gledhill
- G02 - OPTICS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...
- Publication number 20180061613
- Publication date Mar 1, 2018
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPTIMIZING CHARGED PARTICLE BEAMS FORMED BY SHAPED APERT...
- Publication number 20170125207
- Publication date May 4, 2017
- FEI Company
- Richard Swinford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20150380204
- Publication date Dec 31, 2015
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM LOW KV ENHANCEMENT
- Publication number 20150325403
- Publication date Nov 12, 2015
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM LOW KV ENHANCEMENT
- Publication number 20150083929
- Publication date Mar 26, 2015
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused Ion Beam Low kV Enhancement
- Publication number 20140239175
- Publication date Aug 28, 2014
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused Charged Particle Column for Operation at Different Beam Ene...
- Publication number 20130327952
- Publication date Dec 12, 2013
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20130320229
- Publication date Dec 5, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-CHAMBER ELECTRON DETECTOR
- Publication number 20120199738
- Publication date Aug 9, 2012
- FEI Company
- ROBERT GERLACH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-CHAMBER ELECTRON DETECTOR
- Publication number 20080308742
- Publication date Dec 18, 2008
- FEI Company
- Robert Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Mostafa Maazouz

Person

Patents Grantslast 30 patents

Optical alignment correction using convolutional neural network eva...

Combined SEM-CL and FIB-IOE microscopy

Method and apparatus for enhancing SE detection in mirror-based lig...

Imaging and processing for plasma ion source

Method for optimizing charged particle beams formed by shaped apert...

Focused ion beam low kV enhancement

Imaging and processing for plasma ion source

Focused ion beam low kV enhancement

Focused ion beam low kV enhancement

Focused charged particle column for operation at different beam ene...

In-chamber electron detector

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

OPTICAL ALIGNMENT CORRECTION USING CONVOLUTIONAL NEURAL NETWORK EVA...

COMBINED SEM-CL AND FIB-IOE MICROSCOPY

MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES

CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...

METHOD FOR OPTIMIZING CHARGED PARTICLE BEAMS FORMED BY SHAPED APERT...

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

FOCUSED ION BEAM LOW KV ENHANCEMENT

FOCUSED ION BEAM LOW KV ENHANCEMENT

Focused Ion Beam Low kV Enhancement

Focused Charged Particle Column for Operation at Different Beam Ene...

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

IN-CHAMBER ELECTRON DETECTOR

IN-CHAMBER ELECTRON DETECTOR