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Motohiro Kono
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
In-liquid plasma generation device and liquid treatment apparatus
Patent number
11,267,729
Issue date
Mar 8, 2022
SCREEN Holdings Co., Ltd.
Akira Horikoshi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Surface voltmeter
Patent number
7,795,886
Issue date
Sep 14, 2010
Dainippon Screen Mgf. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Grant
Surface voltmeter and surface voltage measurement method
Patent number
7,598,746
Issue date
Oct 6, 2009
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring thickness of thin film formed on...
Patent number
7,427,520
Issue date
Sep 23, 2008
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring relative dielectric constant
Patent number
7,375,537
Issue date
May 20, 2008
Dainippon Screen Mfg. Co., Ltd.
Toshikazu Kitajima
G01 - MEASURING TESTING
Information
Patent Grant
Film thickness measuring method, relative dielectric constant measu...
Patent number
6,915,232
Issue date
Jul 5, 2005
Dainippon Screen Mfg. Co., Ltd.
Toshikazu Kitajima
G01 - MEASURING TESTING
Information
Patent Grant
Method of determining impurity content and apparatus for the same
Patent number
6,278,267
Issue date
Aug 21, 2001
Dainippon Screen Mfg. Co., Ltd.
Hiroshi Okada
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of electrical characteristics of semiconductor wafer
Patent number
6,037,781
Issue date
Mar 14, 2000
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Grant
Probing apparatus for measuring electrical characteristics of semic...
Patent number
4,746,857
Issue date
May 24, 1988
Danippon Screen Mfg. Co. Ltd.
Takamasa Sakai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IN-LIQUID PLASMA GENERATION DEVICE AND LIQUID TREATMENT APPARATUS
Publication number
20200407247
Publication date
Dec 31, 2020
SCREEN Holdings Co., Ltd.
Akira HORIKOSHI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Apparatus and method for removing organic contamination adsorbed on...
Publication number
20090019722
Publication date
Jan 22, 2009
Dainippon Screen Mfg. Co., Ltd.
Yoshiyuki Nakazawa
B08 - CLEANING
Information
Patent Application
Surface voltmeter
Publication number
20080238434
Publication date
Oct 2, 2008
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Application
Surface voltmeter and surface voltage measurement method
Publication number
20070216418
Publication date
Sep 20, 2007
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring relative dielectric constant
Publication number
20050239224
Publication date
Oct 27, 2005
Dainippon Screen Mfg. Co., Ltd.
Toshikazu Kitajima
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring thickness of thin film formed on...
Publication number
20050206911
Publication date
Sep 22, 2005
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kono
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for removing organic contamination adsorbed on...
Publication number
20050198857
Publication date
Sep 15, 2005
Dainippon Screen Mfg. Co., Ltd.
Yoshiyuki Nakazawa
B08 - CLEANING
Information
Patent Application
Film thickness measuring method, relative dielectric constant measu...
Publication number
20040019442
Publication date
Jan 29, 2004
Dainippon Screen Mfg. Co., Ltd.
Toshikazu Kitajima
G01 - MEASURING TESTING