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Motohiro MIYAJIMA
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Itabashi-ku, Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Surveying assistance device, surveying assistance system, surveying...
Patent number
12,140,428
Issue date
Nov 12, 2024
Topcon Corporation
Ryosuke Shimizu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surveying system, staking assistance method, and storage medium sto...
Patent number
11,808,571
Issue date
Nov 7, 2023
Topcon Corporation
Ryosuke Shimizu
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional survey apparatus, three-dimensional survey method...
Patent number
11,692,823
Issue date
Jul 4, 2023
Topcon Corporation
Tadayuki Ito
G01 - MEASURING TESTING
Information
Patent Grant
Surveying device
Patent number
11,085,794
Issue date
Aug 10, 2021
Topcon Corporation
Motohiro Miyajima
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BATTER BOARD INSTALLATION METHOD, BATTER BOARD INSTALLATION PROGRAM...
Publication number
20230272632
Publication date
Aug 31, 2023
TOPCON CORPORATION
Yoshihiro NISHI
E04 - BUILDING
Information
Patent Application
SURVEYING ASSISTANCE DEVICE, SURVEYING ASSISTANCE SYSTEM, SURVEYING...
Publication number
20230204357
Publication date
Jun 29, 2023
TOPCON CORPORATION
Ryosuke SHIMIZU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURVEYING ASSISTANCE DEVICE, SURVEYING ASSISTANCE SYSTEM, SURVEYING...
Publication number
20230168087
Publication date
Jun 1, 2023
TOPCON CORPORATION
Umihiro ICHIRIYAMA
G01 - MEASURING TESTING
Information
Patent Application
SURVEYING ASSISTANCE DEVICE, SURVEYING ASSISTANCE SYSTEM, SURVEYING...
Publication number
20230160695
Publication date
May 25, 2023
TOPCON CORPORATION
Umihiro ICHIRIYAMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURVEYING METHOD, SURVEYING SYSTEM, AND RECORDING MEDIUM STORING SU...
Publication number
20230152095
Publication date
May 18, 2023
TOPCON CORPORATION
Kohei SATO
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE DISPLAY TERMINAL FOR SURVEY ASSISTANCE, SURVEY ASSISTANCE...
Publication number
20230137777
Publication date
May 4, 2023
TOPCON CORPORATION
Keisuke NAKAMURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TILT ANALYSIS METHOD, RECORDING MEDIUM STORING TILT ANALYSIS PROGRA...
Publication number
20230069309
Publication date
Mar 2, 2023
TOPCON CORPORATION
Yoshihiro NISHI
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING DEVICE CONTRO...
Publication number
20230035788
Publication date
Feb 2, 2023
TOPCON CORPORATION
Motohiro MIYAJIMA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SURVEY METHOD, MOBILE TERMINAL, SURVEY SYSTEM, AND STORAGE MEDIUM
Publication number
20230003527
Publication date
Jan 5, 2023
TOPCON CORPORATION
Umihiro ICHIRIYAMA
G01 - MEASURING TESTING
Information
Patent Application
STAKING METHOD AND STAKING SYSTEM
Publication number
20220333926
Publication date
Oct 20, 2022
TOPCON CORPORATION
Ryosuke SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
SURVEYING SYSTEM, STAKING ASSISTANCE METHOD, AND STORAGE MEDIUM STO...
Publication number
20220065629
Publication date
Mar 3, 2022
TOPCON CORPORATION
Ryosuke SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
FINISHED SHAPE OBSERVATION METHOD AND OBSERVATION SYSTEM USING GNSS...
Publication number
20220035049
Publication date
Feb 3, 2022
TOPCON CORPORATION
Keisuke NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
SURVEYING SYSTEM, STAKING ASSISTANCE METHOD, AND STORAGE MEDIUM STO...
Publication number
20220034656
Publication date
Feb 3, 2022
TOPCON CORPORATION
Ryosuke SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...
Publication number
20210080577
Publication date
Mar 18, 2021
TOPCON CORPORATION
Tadayuki ITO
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...
Publication number
20210080256
Publication date
Mar 18, 2021
TOPCON CORPORATION
Tadayuki ITO
G02 - OPTICS
Information
Patent Application
SURVEYING DEVICE
Publication number
20210033422
Publication date
Feb 4, 2021
TOPCON CORPORATION
Motohiro MIYAJIMA
G01 - MEASURING TESTING