Motohiro Nakamura

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and image generation method
- Patent number 12,278,084
- Issue date Apr 15, 2025
- Jeol Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and objective lens
- Patent number 12,261,014
- Issue date Mar 25, 2025
- Jeol Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of axial alignment of charg...
- Patent number 8,742,343
- Issue date Jun 3, 2014
- Jeol Ltd.
- Mitsuru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making axial alignment of charged particle beam and charg...
- Patent number 8,563,926
- Issue date Oct 22, 2013
- Jeol Ltd.
- Mitsuru Yamada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Image Generation Method
- Publication number 20230015400
- Publication date Jan 19, 2023
- JEOL Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Objective Lens
- Publication number 20230014270
- Publication date Jan 19, 2023
- JEOL Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Axial Alignment of Charg...
- Publication number 20130320210
- Publication date Dec 5, 2013
- Mitsuru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Making Axial Alignment of Charged Particle Beam and Charg...
- Publication number 20120138793
- Publication date Jun 7, 2012
- JEOL Ltd.
- Mitsuru Yamada
- H01 - BASIC ELECTRIC ELEMENTS