TREA

Motoi Wada

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  • Kyoto, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Analytical device
    • Patent number 11,295,939
    • Issue date Apr 5, 2022
    • Shimadzu Corporation
    • Hidenori Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion analyzer
    • Patent number 10,998,177
    • Issue date May 4, 2021
    • Shimadzu Corporation
    • Hidenori Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Atomic flux measurement device
    • Patent number 9,658,191
    • Issue date May 23, 2017
    • The Doshisha
    • Tadashi Ohachi
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Method and apparatus for diagnosing abnormal state of sodium (NA)--...
    • Patent number 4,881,026
    • Issue date Nov 14, 1989
    • Hitachi, Ltd.
    • Yasumasa Ishida
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ION ANALYZER
    • Publication number 20200111654
    • Publication date Apr 9, 2020
    • SHIMADZU CORPORATION
    • Hidenori TAKAHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ANALYTICAL DEVICE
    • Publication number 20190333748
    • Publication date Oct 31, 2019
    • Shimadzu Corporation
    • Hidenori TAKAHASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ATOMIC FLUX MEASUREMENT DEVICE
    • Publication number 20130124124
    • Publication date May 16, 2013
    • ARIOS INC.
    • Tadashi OHACHI
    • C30 - CRYSTAL GROWTH