Motoki Imamura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 9,176,008
- Issue date Nov 3, 2015
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Carrier and adhesion amount measuring apparatus, and measuring meth...
- Patent number 8,969,807
- Issue date Mar 3, 2015
- Advantest Corporation
- Motoki Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,493,057
- Issue date Jul 23, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,481,938
- Issue date Jul 9, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring apparatus
- Patent number 8,279,438
- Issue date Oct 2, 2012
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Collection medium and collection amount measuring apparatus, and me...
- Patent number 8,210,035
- Issue date Jul 3, 2012
- Advantest Corporation
- Motoki Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measurement method, a pro...
- Patent number 8,183,528
- Issue date May 22, 2012
- Advantest Corporation
- Eiji Kato
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus
- Patent number 8,053,733
- Issue date Nov 8, 2011
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Polarization mode dispersion measuring device, method, recording me...
- Patent number 7,006,207
- Issue date Feb 28, 2006
- Advantest Corporation
- Takeshi Ozeki
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, the method thereof and...
- Patent number 6,678,041
- Issue date Jan 13, 2004
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring optical characteristics and reco...
- Patent number 6,654,104
- Issue date Nov 25, 2003
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, the method thereof and...
- Patent number 6,519,028
- Issue date Feb 11, 2003
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring an optical transfer characteristic
- Patent number 6,493,074
- Issue date Dec 10, 2002
- Advantest Corporation
- Motoki Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring optical characteristics and reco...
- Patent number 6,433,865
- Issue date Aug 13, 2002
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20130240736
- Publication date Sep 19, 2013
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...
- Publication number 20130075612
- Publication date Mar 28, 2013
- Advantest Corporation
- Motoki IMAMURA
- G01 - MEASURING TESTING
Information Patent Application
CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...
- Publication number 20110097649
- Publication date Apr 28, 2011
- Advantest Corporation
- Motoki IMAMURA
- G01 - MEASURING TESTING
Information Patent Application
COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND ME...
- Publication number 20110094300
- Publication date Apr 28, 2011
- Advantest Corporation
- Motoki IMAMURA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS
- Publication number 20110075127
- Publication date Mar 31, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20110001048
- Publication date Jan 6, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20100295534
- Publication date Nov 25, 2010
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...
- Publication number 20100271001
- Publication date Oct 28, 2010
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING APPARATUS
- Publication number 20100014079
- Publication date Jan 21, 2010
- Advantest Coporation
- Tomoyu YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Polarization mode dispersion measuring device, method, recording me...
- Publication number 20050052638
- Publication date Mar 10, 2005
- Takeshi Ozeki
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring optical characteristics and reco...
- Publication number 20020044273
- Publication date Apr 18, 2002
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring optical characteristics and reco...
- Publication number 20020044274
- Publication date Apr 18, 2002
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristics measuring apparatus, the method therof, and...
- Publication number 20020024655
- Publication date Feb 28, 2002
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristic measuring apparatus, the method thereof and...
- Publication number 20020003621
- Publication date Jan 10, 2002
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING

Motoki Imamura

Person

Patents Grantslast 30 patents

Electromagnetic wave measuring apparatus, measuring method, program...

Carrier and adhesion amount measuring apparatus, and measuring meth...

Electromagnetic wave measuring apparatus, measuring method, program...

Electromagnetic wave measuring apparatus, measuring method, program...

Optical measuring apparatus

Collection medium and collection amount measuring apparatus, and me...

Electromagnetic wave measuring apparatus, measurement method, a pro...

Electromagnetic wave measuring apparatus

Polarization mode dispersion measuring device, method, recording me...

Optical characteristic measuring apparatus, the method thereof and...

Apparatus and method for measuring optical characteristics and reco...

Optical characteristic measuring apparatus, the method thereof and...

Method and apparatus for measuring an optical transfer characteristic

Apparatus and method for measuring optical characteristics and reco...

Patents Applicationslast 30 patents

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...

CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...

COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND ME...

ELECTROMAGNETIC WAVE MEASURING APPARATUS

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...

OPTICAL MEASURING APPARATUS

Polarization mode dispersion measuring device, method, recording me...

Apparatus and method for measuring optical characteristics and reco...

Apparatus and method for measuring optical characteristics and reco...

Optical characteristics measuring apparatus, the method therof, and...

Optical characteristic measuring apparatus, the method thereof and...