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Motoshi SETO

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  • Yokohama Kanagawa, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR MEMORY DEVICE
    • Publication number 20210288062
    • Publication date Sep 16, 2021
    • KIOXIA Corporation
    • Motoshi SETO
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    METHOD AND DEVICE FOR INSPECTING A SEMICONDUCTOR DEVICE
    • Publication number 20200264110
    • Publication date Aug 20, 2020
    • Toshiba Memory Corporation
    • Motoshi SETO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200075505
    • Publication date Mar 5, 2020
    • Toshiba Memory Corporation
    • Motoshi SETO
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20190088599
    • Publication date Mar 21, 2019
    • Toshiba Memory Corporation
    • Motoshi SETO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    FAULT DETECTION APPARATUS
    • Publication number 20180136272
    • Publication date May 17, 2018
    • Toshiba Memory Corporation
    • Motoshi Seto
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
    • Publication number 20160351441
    • Publication date Dec 1, 2016
    • Kabushiki Kaisha Toshiba
    • Satoshi TSUKIYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR CHIPS
    • Publication number 20150212147
    • Publication date Jul 30, 2015
    • Kabushiki Kaisha Toshiba
    • Motoshi SETO
    • G01 - MEASURING TESTING
  • Information Patent Application

    FAULT DETECTION APPARATUS
    • Publication number 20140372068
    • Publication date Dec 18, 2014
    • KABUSHIKI KAISHA TOSHIBA
    • Motoshi SETO
    • G01 - MEASURING TESTING
  • Information Patent Application

    HOLDER FOR MEASUREMENT AND MEASUREMENT APPARATUS
    • Publication number 20130106458
    • Publication date May 2, 2013
    • Motoshi SETO
    • G01 - MEASURING TESTING