Motoyoshi KOYANAGI

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Nagasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device inspection apparatus
- Patent number 12,123,906
- Issue date Oct 22, 2024
- Mitsubishi Electric Corporation
- Kazuya Itose
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection jig
- Patent number 10,895,586
- Issue date Jan 19, 2021
- Mitsubishi Electric Corporation
- Tetsuya Kitagawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE INSPECTION APPARATUS
- Publication number 20230131641
- Publication date Apr 27, 2023
- Mitsubishi Electric Corporation
- Kazuya ITOSE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION JIG
- Publication number 20180164344
- Publication date Jun 14, 2018
- Mitsubishi Electric Corporation
- Tetsuya KITAGAWA
- G01 - MEASURING TESTING