Motoyuki Hirooka

Person

Kumagaya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and sample observing method using the same
- Patent number 8,695,110
- Issue date Apr 8, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of observing sample using the...
- Patent number 8,635,710
- Issue date Jan 21, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Graphene grown substrate and electronic/photonic integrated circuit...
- Patent number 8,476,739
- Issue date Jul 2, 2013
- Hitachi, Ltd.
- Makoto Okai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Circuit board including a graphene film having contact region cover...
- Patent number 8,471,237
- Issue date Jun 25, 2013
- Hitachi, Ltd.
- Makoto Okai
- G02 - OPTICS
Information Patent Grant
Micro contact prober
- Patent number 8,438,660
- Issue date May 7, 2013
- Hitachi High-Technologies Corporation
- Motoyuki Hirooka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Graphene grown substrate and electronic/photonic integrated circuit...
- Patent number 8,410,474
- Issue date Apr 2, 2013
- Hitachi, Ltd.
- Makoto Okai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of observing sample using the...
- Patent number 8,407,811
- Issue date Mar 26, 2013
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electrically connected graphene-metal electrode device, and electro...
- Patent number 8,278,658
- Issue date Oct 2, 2012
- Hitachi, Ltd.
- Makoto Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and sample observing method using the same
- Patent number 8,272,068
- Issue date Sep 18, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of observing sample using the...
- Patent number 8,181,268
- Issue date May 15, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transparent conductive film and electronic device including same
- Patent number 7,976,950
- Issue date Jul 12, 2011
- Hitachi, Ltd.
- Makoto Okai
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME
- Publication number 20130145507
- Publication date Jun 6, 2013
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
- Publication number 20120204297
- Publication date Aug 9, 2012
- HITACHI, LTD.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
MICROCONTACT PROBER
- Publication number 20120090056
- Publication date Apr 12, 2012
- Hitachi High-Technologies Corporation
- Motoyuki Hirooka
- G01 - MEASURING TESTING
Information Patent Application
GRAPHENE CIRCUIT BOARD HAVING IMPROVED ELECTRICAL CONTACT BETWEEN G...
- Publication number 20110198558
- Publication date Aug 18, 2011
- Makoto Okai
- G02 - OPTICS
Information Patent Application
GRAPHENE GROWN SUBSTRATE AND ELECTRONIC/PHOTONIC INTEGRATED CIRCUIT...
- Publication number 20110175060
- Publication date Jul 21, 2011
- Makoto Okai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
- Publication number 20100325761
- Publication date Dec 23, 2010
- Hitachi, Ltd
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
TRANSPARENT CONDUCTIVE FILM AND ELECTRONIC DEVICE INCLUDING SAME
- Publication number 20100304131
- Publication date Dec 2, 2010
- Makoto OKAI
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ELECTRICALLY CONNECTED GRAPHENE-METAL ELECTRODE DEVICE, AND ELECTRO...
- Publication number 20100270512
- Publication date Oct 28, 2010
- Hitachi, Ltd.
- Makoto Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE...
- Publication number 20100218287
- Publication date Aug 26, 2010
- Toshihiko NAKATA
- G01 - MEASURING TESTING
Information Patent Application
GRAPHENE GROWN SUBSTRATE AND ELECTRONIC/PHOTONIC INTEGRATED CIRCUIT...
- Publication number 20100200839
- Publication date Aug 12, 2010
- Makoto Okai
- C30 - CRYSTAL GROWTH
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME
- Publication number 20100064396
- Publication date Mar 11, 2010
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR SCANNING PROBE MICROSCOPE
- Publication number 20100043108
- Publication date Feb 18, 2010
- HITACHI CONSTRUCTION MACHINERY CO., LTD.
- Motoyuki Hirooka
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS HAVING NANOTUBE PROBE
- Publication number 20090243637
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- Makoto OKAI
- G01 - MEASURING TESTING
Information Patent Application
Cantilever and inspecting apparatus
- Publication number 20070051887
- Publication date Mar 8, 2007
- Kishio Hidaka
- G01 - MEASURING TESTING

Motoyuki Hirooka

Person

Patents Grantslast 30 patents

Scanning probe microscope and sample observing method using the same

Scanning probe microscope and method of observing sample using the...

Graphene grown substrate and electronic/photonic integrated circuit...

Circuit board including a graphene film having contact region cover...

Micro contact prober

Graphene grown substrate and electronic/photonic integrated circuit...

Scanning probe microscope and method of observing sample using the...

Electrically connected graphene-metal electrode device, and electro...

Scanning probe microscope and sample observing method using the same

Scanning probe microscope and method of observing sample using the...

Transparent conductive film and electronic device including same

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME

Scanning Probe Microscope and Method of Observing Sample Using the...

MICROCONTACT PROBER

GRAPHENE CIRCUIT BOARD HAVING IMPROVED ELECTRICAL CONTACT BETWEEN G...

GRAPHENE GROWN SUBSTRATE AND ELECTRONIC/PHOTONIC INTEGRATED CIRCUIT...

Scanning Probe Microscope and Method of Observing Sample Using the...

TRANSPARENT CONDUCTIVE FILM AND ELECTRONIC DEVICE INCLUDING SAME

ELECTRICALLY CONNECTED GRAPHENE-METAL ELECTRODE DEVICE, AND ELECTRO...

SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE...

GRAPHENE GROWN SUBSTRATE AND ELECTRONIC/PHOTONIC INTEGRATED CIRCUIT...

SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME

PROBE FOR SCANNING PROBE MICROSCOPE

MEASURING APPARATUS HAVING NANOTUBE PROBE

Cantilever and inspecting apparatus