Motoyuki Watanabe

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Film thickness measurement device and film thickness measurement me...
- Patent number 8,885,173
- Issue date Nov 11, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement device and measurement method
- Patent number 8,649,023
- Issue date Feb 11, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer, spectrometry, and spectrometry program
- Patent number 8,462,337
- Issue date Jun 11, 2013
- Hamamatsu Photonics K.K.
- Motoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent correalated spectrometric analysis device
- Patent number 7,400,396
- Issue date Jul 15, 2008
- Hamanatsu Photonics K.K.
- Hirohiko Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Thickness measuring apparatus, thickness measuring method, and wet...
- Patent number 6,897,964
- Issue date May 24, 2005
- Hamamatsu Photonics K.K.
- Teruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring fluorescence, apparatus for measuring fluoresc...
- Patent number 6,897,953
- Issue date May 24, 2005
- Hamamatsu Photonics K.K.
- Motoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measuring apparatus, thickness measuring method, and wet...
- Patent number 6,768,552
- Issue date Jul 27, 2004
- Hamamatsu Photonics K.K.
- Teruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Feeble light measuring device
- Patent number 5,250,795
- Issue date Oct 5, 1993
- Hamamatsu Photonics K.K.
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Framing camera
- Patent number 5,017,829
- Issue date May 21, 1991
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical waveform observing apparatus
- Patent number 4,945,224
- Issue date Jul 31, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...
- Publication number 20120218561
- Publication date Aug 30, 2012
- HAMAMATSU PHOTONICS K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20110299097
- Publication date Dec 8, 2011
- Hamamatsu Photonics K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM
- Publication number 20110255085
- Publication date Oct 20, 2011
- Hamamatsu Photonics K.K.
- Motoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent correalated spectrometric analysis device
- Publication number 20060262301
- Publication date Nov 23, 2006
- HAMAMATSU PHOTONICS K. K.
- Hirohiko Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for measuring flourescence, apparatus for measuring flouresc...
- Publication number 20030151000
- Publication date Aug 14, 2003
- Motoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Thickness measuring apparatus, thickness measuring method, and wet...
- Publication number 20030121889
- Publication date Jul 3, 2003
- Teruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Thickness measuring apparatus, thickness measuring method, and wet...
- Publication number 20030090671
- Publication date May 15, 2003
- Teruo Takahashi
- G01 - MEASURING TESTING

Motoyuki Watanabe

Person

Patents Grantslast 30 patents

Film thickness measurement device and film thickness measurement me...

Film thickness measurement device and measurement method

Spectrometer, spectrometry, and spectrometry program

Fluorescent correalated spectrometric analysis device

Thickness measuring apparatus, thickness measuring method, and wet...

Method for measuring fluorescence, apparatus for measuring fluoresc...

Thickness measuring apparatus, thickness measuring method, and wet...

Feeble light measuring device

Framing camera

Optical waveform observing apparatus

Patents Applicationslast 30 patents

FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...

FILM THICKNESS MEASUREMENT DEVICE AND MEASUREMENT METHOD

SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM

Fluorescent correalated spectrometric analysis device

Method for measuring flourescence, apparatus for measuring flouresc...

Thickness measuring apparatus, thickness measuring method, and wet...

Thickness measuring apparatus, thickness measuring method, and wet...