Motoyuki Yamagami

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Takatsuki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Substrate contamination analysis system
- Patent number 11,022,572
- Issue date Jun 1, 2021
- Rigaku Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzing system
- Patent number 9,989,484
- Issue date Jun 5, 2018
- Rigaku Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometric system and a program for use therein
- Patent number 6,937,691
- Issue date Aug 30, 2005
- Rigaku Industrial Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
Sample preprocessing system for a fluorescent X-ray analysis and X-...
- Patent number 6,735,276
- Issue date May 11, 2004
- Rigaku Industrial Corporation
- Akihiro Ikeshita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analysis and apparatus therefor
- Patent number 6,611,577
- Issue date Aug 26, 2003
- Rigaku Industrial Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE CONTAMINATION ANALYSIS SYSTEM
- Publication number 20200386697
- Publication date Dec 10, 2020
- Rigaku Corporation
- Motoyuki YAMAGAMI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZING SYSTEM
- Publication number 20160299089
- Publication date Oct 13, 2016
- Rigaku Corporation
- Motoyuki YAMAGAMI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYSIS AND APPARATUS THEREFOR
- Publication number 20030152191
- Publication date Aug 14, 2003
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Application
Sample preprocessing system for a fluorescent X-ray analysis and X-...
- Publication number 20030053589
- Publication date Mar 20, 2003
- Akihiro Ikeshita
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometric system and a program for use therein
- Publication number 20030043963
- Publication date Mar 6, 2003
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Application
X-ray spectroscopic analyzer having sample surface observation mech...
- Publication number 20010021240
- Publication date Sep 13, 2001
- Shinjirou Kojima
- G01 - MEASURING TESTING