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Bangalore, IN
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last 30 patents
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Patent Grant
Eddy current probe and inspection method
Patent number
7,154,265
Issue date
Dec 26, 2006
General Electric Company
Mottito Togo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEVICES, METHODS AND SYSTEMS FOR MEASURING ONE OR MORE CHARACTERIST...
Publication number
20090158821
Publication date
Jun 25, 2009
GENERAL ELECTRIC COMPANY
Zongqi Sun
G01 - MEASURING TESTING
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Patent Application
EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
Publication number
20070222439
Publication date
Sep 27, 2007
GENERAL ELECTRIC COMPANY
Changting Wang
G01 - MEASURING TESTING
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Patent Application
Eddy current array probes with enhanced drive fields
Publication number
20060132123
Publication date
Jun 22, 2006
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Eddy current probe and inspection method
Publication number
20060132124
Publication date
Jun 22, 2006
General Electric Company
Mottito Togo
G01 - MEASURING TESTING