Moyra K. McManus

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Peekskill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Testing and operating a multiprocessor chip with processor redundancy
- Patent number 8,868,975
- Issue date Oct 21, 2014
- International Business Machines Corporation
- Ralph E. Bellofatto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced speed sorting of microprocessors at wafer test
- Patent number 8,049,526
- Issue date Nov 1, 2011
- International Business Machines Corporation
- Moyra Kathleen McManus
- G01 - MEASURING TESTING
Information Patent Grant
System and method for spatial, temporal, energy-resolving detection...
- Patent number 7,078,694
- Issue date Jul 18, 2006
- International Business Machines Corporation
- Stanislav V. Polonsky
- G01 - MEASURING TESTING
Information Patent Grant
Analysis methods of leakage current luminescence in CMOS circuits
- Patent number 6,909,295
- Issue date Jun 21, 2005
- International Business Machines Corporation
- Stanislav V. Polonsky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING AND OPERATING A MULTIPROCESSOR CHIP WITH PROCESSOR REDUNDANCY
- Publication number 20130031418
- Publication date Jan 31, 2013
- International Business Machines Corporation
- Ralph E. Bellofatto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Enhanced Speed Sorting of Microprocessors at Wafer Test
- Publication number 20090306815
- Publication date Dec 10, 2009
- Moyra Kathleen McManus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis methods of leakage current luminescence in CMOS circuits
- Publication number 20050062490
- Publication date Mar 24, 2005
- International Business Machines Corporation
- Stanislav V. Polonsky
- G01 - MEASURING TESTING
Information Patent Application
System and method for spatial, temporal, energy-resolving detection...
- Publication number 20040016883
- Publication date Jan 29, 2004
- International Business Machines Corporation
- Stanislav V. Polonsky
- G01 - MEASURING TESTING