MU-SHENG LIAO

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HSIN-CHU, TW

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Patents Grantslast 30 patents

Information Patent Grant
Load board
- Patent number 7,094,068
- Issue date Aug 22, 2006
- Silicon Integrated Systems Corp.
- Ching-Jung Huang
- G01 - MEASURING TESTING
Information Patent Grant
All-in-one polishing process for a semiconductor wafer
- Patent number 6,913,520
- Issue date Jul 5, 2005
- United Microelectronics Corp.
- Mu-Liang Liao
- B24 - GRINDING POLISHING
Information Patent Grant
Jigs for semiconductor components
- Patent number 6,498,505
- Issue date Dec 24, 2002
- Silicon Integrated Systems Corporation
- Mu-Sheng Liao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for eliminating electrostatic destruction
- Patent number 6,444,034
- Issue date Sep 3, 2002
- Silicon Integrated Systems Corp.
- Yi-Chang Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for picking-up an integrated circuit component
- Patent number 6,287,071
- Issue date Sep 11, 2001
- Silicon Integrated Systems Corp.
- Lai-Fue Hsieh
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Testing apparatus for testing a ball grid array device
- Patent number 6,204,676
- Issue date Mar 20, 2001
- Silicon Integrated Systems Corp.
- Yi-Chang Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Contactor system for a ball grid array device
- Patent number 6,075,255
- Issue date Jun 13, 2000
- Silicon Integrated Systems Company
- Mu-Sheng Liao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOCKET BASE ADAPTABLE TO A LOAD BOARD FOR TESTING IC
- Publication number 20070103179
- Publication date May 10, 2007
- Silicon Integrated Systems Corp.
- SHOU-NAN TSAI
- G01 - MEASURING TESTING
Information Patent Application
ALL-IN-ONE POLISHING PROCESS FOR A SEMICONDUCTOR WAFER
- Publication number 20050159083
- Publication date Jul 21, 2005
- Mu-Liang Liao
- B24 - GRINDING POLISHING
Information Patent Application
Semiconductor package device testing apparatus
- Publication number 20040075091
- Publication date Apr 22, 2004
- Ching-jung Huang
- G01 - MEASURING TESTING
Information Patent Application
Alignment apparatus for an IC test handler
- Publication number 20030164716
- Publication date Sep 4, 2003
- Yi-Chang Hsieh
- G01 - MEASURING TESTING
Information Patent Application
Jigs for semiconductor components
- Publication number 20020125902
- Publication date Sep 12, 2002
- Mu-Sheng Liao
- G01 - MEASURING TESTING