Mudasir Shafat Kawoosa

Person

Srinagar, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 11,899,063
- Issue date Feb 13, 2024
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Scan test control decoder with storage elements for use within inte...
- Patent number 11,747,399
- Issue date Sep 5, 2023
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 11,408,936
- Issue date Aug 9, 2022
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Scan test control decoder with storage elements for use within inte...
- Patent number 11,402,432
- Issue date Aug 2, 2022
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Non-interleaved scan operation for achieving higher scan throughput...
- Patent number 10,877,093
- Issue date Dec 29, 2020
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Scan test control decoder with storage elements for use within inte...
- Patent number 10,852,353
- Issue date Dec 1, 2020
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically protective scan data control
- Patent number 10,746,797
- Issue date Aug 18, 2020
- Texas Instruments Incorporated
- Rubin Ajit Parekhji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 10,739,402
- Issue date Aug 11, 2020
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Non-interleaved scan operation for achieving higher scan throughput...
- Patent number 10,088,525
- Issue date Oct 2, 2018
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 10,060,979
- Issue date Aug 28, 2018
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for test time reduction using fractional data...
- Patent number 9,970,987
- Issue date May 15, 2018
- Texas Instruments Incorporated
- Sreenath Narayanan Potty
- G01 - MEASURING TESTING
Information Patent Grant
Increase data transfer throughput by enabling dynamic JTAG test mod...
- Patent number 9,772,376
- Issue date Sep 26, 2017
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for test time reduction using fractional data...
- Patent number 9,448,284
- Issue date Sep 20, 2016
- Texas Instruments Incorporated
- Sreenath Narayanan Potty
- G01 - MEASURING TESTING
Information Patent Grant
Scan throughput enhancement in scan testing of a device-under-test
- Patent number 9,347,991
- Issue date May 24, 2016
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G11 - INFORMATION STORAGE
Information Patent Grant
Handling slower scan outputs at optimal frequency
- Patent number 9,261,560
- Issue date Feb 16, 2016
- Texas Instruments Incorporated
- Rajesh Kumar Mittal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...
- Publication number 20220326302
- Publication date Oct 13, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...
- Publication number 20220326303
- Publication date Oct 13, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...
- Publication number 20210041497
- Publication date Feb 11, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...
- Publication number 20200333397
- Publication date Oct 22, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
NON-INTERLEAVED SCAN OPERATION FOR ACHIEVING HIGHER SCAN THROUGHPUT...
- Publication number 20180372798
- Publication date Dec 27, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...
- Publication number 20180321311
- Publication date Nov 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
Generating Multiple Pseudo Static Control Signals Using On-chip JTA...
- Publication number 20180038910
- Publication date Feb 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
Non-Interleaved Scan Operation for Achieving Higher Scan Throughput...
- Publication number 20170234925
- Publication date Aug 17, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Test Time Reduction Using Fractional Data...
- Publication number 20160356849
- Publication date Dec 8, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Sreenath Narayanan Potty
- G01 - MEASURING TESTING
Information Patent Application
SCAN THROUGHPUT ENHANCEMENT IN SCAN TESTING OF A DEVICE-UNDER-TEST
- Publication number 20160131704
- Publication date May 12, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TEST TIME REDUCTION USING FRACTIONAL DATA...
- Publication number 20150323596
- Publication date Nov 12, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Sreenath Narayanan Potty
- G01 - MEASURING TESTING
Information Patent Application
HANDLING SLOWER SCAN OUTPUTS AT OPTIMAL FREQUENCY
- Publication number 20150185283
- Publication date Jul 2, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Rajesh Kumar Mittal
- G01 - MEASURING TESTING

Mudasir Shafat Kawoosa

Person

Patents Grantslast 30 patents

Generating multiple pseudo static control signals using on-chip JTA...

Scan test control decoder with storage elements for use within inte...

Generating multiple pseudo static control signals using on-chip JTA...

Scan test control decoder with storage elements for use within inte...

Non-interleaved scan operation for achieving higher scan throughput...

Scan test control decoder with storage elements for use within inte...

Dynamically protective scan data control

Generating multiple pseudo static control signals using on-chip JTA...

Non-interleaved scan operation for achieving higher scan throughput...

Generating multiple pseudo static control signals using on-chip JTA...

Method and apparatus for test time reduction using fractional data...

Increase data transfer throughput by enabling dynamic JTAG test mod...

Method and apparatus for test time reduction using fractional data...

Scan throughput enhancement in scan testing of a device-under-test

Handling slower scan outputs at optimal frequency

Patents Applicationslast 30 patents

SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...

GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...

SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...

GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...

NON-INTERLEAVED SCAN OPERATION FOR ACHIEVING HIGHER SCAN THROUGHPUT...

GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...

Generating Multiple Pseudo Static Control Signals Using On-chip JTA...

Non-Interleaved Scan Operation for Achieving Higher Scan Throughput...

Method and Apparatus for Test Time Reduction Using Fractional Data...

SCAN THROUGHPUT ENHANCEMENT IN SCAN TESTING OF A DEVICE-UNDER-TEST

METHOD AND APPARATUS FOR TEST TIME REDUCTION USING FRACTIONAL DATA...

HANDLING SLOWER SCAN OUTPUTS AT OPTIMAL FREQUENCY