Muhammad WAQAR

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Al-Khobar, SA

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Patents Applicationslast 30 patents

Information Patent Application
Transient Feature Recognition Technique for Defect Detection, Class...
- Publication number 20240288130
- Publication date Aug 29, 2024
- THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Moez LOUATI
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Defect Detection
- Publication number 20240201041
- Publication date Jun 20, 2024
- THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Muhammad WAQAR
- G06 - COMPUTING CALCULATING COUNTING